Patents by Inventor Marc Szeto-Millstone

Marc Szeto-Millstone has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170011077
    Abstract: Methods, systems, and techniques for annotating large amounts of data are provided. Example embodiments provide a Scalable Annotation Architecture (a “SAS”), which builds predictive models for an annotation from the ground up, without knowledge of the data. The SAS operates by performing in an iterative fashion a process that seeds training data and hypothesizes a predictive model based upon that data, then sends samples of the data to a crowdsourcing environment to provide selective verification. This process is repeated iteratively until a desired precision is reached and then the model is employed independently in a production system. In one embodiment, the SAS is used to annotate data provided by an open data platform.
    Type: Application
    Filed: July 7, 2016
    Publication date: January 12, 2017
    Inventors: Theodore Nicholas Kypreos, Jason Kroll, Marc Szeto-Millstone, Navdeep Singh Dhillon, Ayn Leslie-Cook
  • Patent number: 8266554
    Abstract: A method for obtaining mask and source patterns for printing integrated circuit patterns includes providing initial representations of a plurality of mask and source patterns. The method identifies long-range and short-range factors in the representations of the plurality of mask and source patterns, and provides a plurality of clips including a specified number of mask patterns. Short-range factors having overlapping ranges for each of the clips are specified. The method includes determining an initial processing priority for the plurality of clips, and determining a patterning relationship between integrated circuit patterns and the mask and source patterns. A primary objective is determined which expresses the printability of the integrated circuit patterns in terms of the patterning relationship.
    Type: Grant
    Filed: August 5, 2011
    Date of Patent: September 11, 2012
    Assignee: International Business Machines Corporation
    Inventors: Saeed Bagheri, Francisco Barahona, Laszlo Ladanyi, Jonathan Lee, David O. Melville, Alan E. Rosenbluth, Daniele P. Scarpazza, Marc A. Szeto-Millstone, Kehan Tian, Andreas Waechter
  • Publication number: 20120047471
    Abstract: A method for obtaining mask and source patterns for printing integrated circuit patterns includes providing initial representations of a plurality of mask and source patterns. The method identifies long-range and short-range factors in the representations of the plurality of mask and source patterns, and provides a plurality of clips including a specified number of mask patterns. Short-range factors having overlapping ranges for each of the clips are specified. The method includes determining an initial processing priority for the plurality of clips, and determining a patterning relationship between integrated circuit patterns and the mask and source patterns. A primary objective is determined which expresses the printability of the integrated circuit patterns in terms of the patterning relationship.
    Type: Application
    Filed: August 5, 2011
    Publication date: February 23, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Saeed Bagheri, Francisco Barahona, Laszlo Ladanyi, Jonathan Lee, David O. Melville, Alan E. Rosenbluth, Daniele P. Scarpazza, Marc A. Szeto-Millstone, Kehan Tian, Andreas Waechter