Patents by Inventor Marc Wichterich

Marc Wichterich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11620558
    Abstract: One or more defect analysis iterations are performed on a collection of records. In a given iteration, a defect presence probability is obtained using a machine learning model for a record group. An estimated audit benefit is then assigned to the record group based at least partly on a defect remediation importance score of the record group. An indication of the estimated audit benefit of the record group is provided to an auditor. An audited defect status for the record group, generated by the auditor, is used to initiate one or more automated actions.
    Type: Grant
    Filed: August 25, 2020
    Date of Patent: April 4, 2023
    Assignee: Amazon Technologies, Inc.
    Inventors: Yifan Xu, Xue Wang, Marc Wichterich