Patents by Inventor Marcel VAN WENSVEEN

Marcel VAN WENSVEEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230184696
    Abstract: The present invention relates to a method to reduce drift of a sample and/or its image in a microscopy system, wherein the method comprises determining an expected thermal drift of the sample, and compensating for the drift of the sample and/or its image based upon the expected thermal drift. The present invention also relates to a corresponding microscopy system and a computer program product to perform the method according to the present invention.
    Type: Application
    Filed: December 15, 2022
    Publication date: June 15, 2023
    Applicant: FEI Company
    Inventors: Hugo VAN LEEUWEN, Edwin VERSCHUEREN, Johannes VAN DEN OETELAAR, Martin VERHEIJEN, Ronald LAMERS, Marcel VAN WENSVEEN