Abstract: A proximity fuze which employs a reflected beam of pulse modulated infrared adiation to determine the distance from the weapon to the target. Modulation is accomplished electronically. Correlation circuitry comprising a logic network is provided to continuously compare the received signal with the modulation signal.

Abstract: A fuze for accurately sensing the distance to a target irrespective of the resence of a medium intermediate of the fuze and the target. The fuze includes a source of radiation which is transmitted to the target and a detector which detects the backscatter from the target and intervening media. The detector output is amplified in an amplifier connected thereto and filtered in a filter connected to the amplifier to provide an output signal which is threshold detected in a threshold device connected to the amplifier. The threshold detected signal is applied to a firing circuit to provide a signal responsive to a predetermined distance above the target.

Abstract: An improvement of the Wunsch test method for measuring pulsed-power failure thresholds of bipolar transistors and p-n junction diodes using short-pulse testing with pulse durations of 100 nanoseconds or less. A square pulse of reverse current is used to damage the p-n junction of interest, and the absorbed power is computed from oscilloscope traces of voltage and current. A constant-current pulse is used rather than the constant power pulse of the Wunsch test method, thereby limiting the damage done to the device and permitting a wide range of device parameter to be observed. The degree of device degradation is utilized to distinguish between true and false measurements of thresholddamage input-power and also to ensure that the individual failure levels of specimens of a sample actually are threshold failure levels rather than overkill levels, in order that the average of these levels represents, approximately, a 50% probability of failure for the sample.