Abstract: Sample holder for a material testing device, said sample holder comprising: —a holder body having an end face defining a plane; —a sample plate arranged at said end face of the holder body and arranged to receive a sample; —a clamping arrangement. According to the invention, said clamping arrangement comprises a clamping ring comprising:—a cylindrical portion sized to fit over said holder body; —an annular flange extending inwardly from an extremity of the cylindrical portion; —a plurality of resilient tongues extending inwardly from said annular flange; —a plurality of helical slots distributed around the cylindrical portion and each arranged to interact with a corresponding stud provided on said holder body, each helical slot comprising a plurality of notches provided at the edge of the slot situated away from the flange.

Abstract: Sample holder for a material testing device, said sample holder comprising: —a holder body having an end face defining a plane; —a sample plate arranged at said end face of the holder body and arranged to receive a sample; —a clamping arrangement. According to the invention, said clamping arrangement comprises a clamping ring comprising:—a cylindrical portion sized to fit over said holder body; —an annular flange extending inwardly from an extremity of the cylindrical portion; —a plurality of resilient tongues extending inwardly from said annular flange; —a plurality of helical slots distributed around the cylindrical portion and each arranged to interact with a corresponding stud provided on said holder body, each helical slot comprising a plurality of notches provided at the edge of the slot situated away from the flange.

Abstract: Heating arrangement for a materials testing device, the materials testing device comprising at least one surface measurement probe adapted to be brought into contact with a surface of a sample, the heating arrangement comprising a probe heater comprising: an infrared emitting element adapted to emit infrared radiation; a reflector having a reflective surface arranged to direct said infrared radiation towards a distal end of said surface measurement probe. According to the invention, the reflector comprises a first focal point and a second focal point, the infrared emitting element being situated substantially at said first focal point.

Abstract: Surface measurement probe comprising: a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end; a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state; a probe tip supported at the distal end of the probe body and arranged to contact a sample; a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.

Abstract: Surface measurement probe comprising: a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end; a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state; a probe tip supported at the distal end of the probe body and arranged to contact a sample; a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.

Abstract: Heating arrangement for a materials testing device, the materials testing device comprising at least one surface measurement probe adapted to be brought into contact with a surface of a sample, the heating arrangement comprising a probe heater comprising: an infrared emitting element adapted to emit infrared radiation; a reflector having a reflective surface arranged to direct said infrared radiation towards a distal end of said surface measurement probe. According to the invention, the reflector comprises a first focal point and a second focal point, the infrared emitting element being situated substantially at said first focal point.

Abstract: The invention consists of a measurement device for measuring the force applied by a contact member on the surface of a sample, comprising a vacuum or controlled atmosphere chamber in which there are housed the sample and the contact member, mechanical means for transmitting the force exerted by the contact member in the form of the displacement of one or several flexible members and one or several sensors suitable for measuring said displacement. The device comprises motor-driven linear micropositioners incorporated inside the vacuum or controlled atmosphere chamber for positioning sensor(s). As a result of the system, it is not necessary to break the vacuum to calibrate the sensors, saving time and facilitating the measurement.

Abstract: The invention discloses a sample-support element for ultra-high vacuums comprising a main chamber and a supplementary chamber for the sample holder and the heating/cooling elements, which is pumped by a related pump line. This enables the reduction or total elimination of the negative effect related to the alteration of the residual atmosphere in ultra-high vacuums resulting from heating or cooling the surfaces of the sample holder.

Abstract: The invention discloses a sample-support element for ultra-high vacuums comprising a main chamber and a supplementary chamber for the sample holder and the heating/cooling elements, which is pumped by a related pump line. This enables the reduction or total elimination of the negative effect related to the alteration of the residual atmosphere in ultra-high vacuums resulting from heating or cooling the surfaces of the sample holder.

Abstract: The invention consists of a measurement device for measuring the force applied by a contact member on the surface of a sample, comprising a vacuum or controlled atmosphere chamber in which there are housed the sample and the contact member, mechanical means for transmitting the force exerted by the contact member in the form of the displacement of one or several flexible members and one or several sensors suitable for measuring said displacement. The device comprises motor-driven linear micropositioners incorporated inside the vacuum or controlled atmosphere chamber for positioning sensor(s). As a result of the system, it is not necessary to break the vacuum to calibrate the sensors, saving time and facilitating the measurement.