Patents by Inventor Marco Andre Figueiredo PIMENTEL

Marco Andre Figueiredo PIMENTEL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11580432
    Abstract: System monitors and methods of monitoring a system are disclosed. In one arrangement a system monitor predicts a future state of a system. A data receiving unit receives system data representing a set of one or more measurements performed on the system. A first statistical model is fitted to the system data. The first statistical model is compared to each of a plurality of dictionary entries in a database. Each dictionary entry comprises a second statistical model. The second statistical model is of the same general class as the first statistical model and obtained by fitting the second statistical model to data representing a set of one or more previous measurements performed on a system of the same type as the system being monitored and having a known subsequent state. A prediction of a future state of the system being monitored is output based on the comparison. The first statistical model and the second statistical model are each a stochastic process or approximation to a stochastic process.
    Type: Grant
    Filed: January 3, 2019
    Date of Patent: February 14, 2023
    Assignee: Oxford University Innovation Limited
    Inventors: David Andrew Clifton, Glen Wright Colopy, Marco Andre Figueiredo Pimentel
  • Publication number: 20190156233
    Abstract: System monitors and methods of monitoring a system are disclosed. In one arrangement a system monitor predicts a future state of a system. A data receiving unit receives system data representing a set of one or more measurements performed on the system. A first statistical model is fitted to the system data. The first statistical model is compared to each of a plurality of dictionary entries in a database. Each dictionary entry comprises a second statistical model. The second statistical model is of the same general class as the first statistical model and obtained by fitting the second statistical model to data representing a set of one or more previous measurements performed on a system of the same type as the system being monitored and having a known subsequent state. A prediction of a future state of the system being monitored is output based on the comparison. The first statistical model and the second statistical model are each a stochastic process or approximation to a stochastic process.
    Type: Application
    Filed: January 3, 2019
    Publication date: May 23, 2019
    Inventors: David Andrew CLIFTON, Glen Wright COLOPY, Marco Andre Figueiredo PIMENTEL