Patents by Inventor Marco Beckmann

Marco Beckmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Battery terminal with a star-point connection switch configuration for a vehicle electrical system
    Patent number: 11292405
    Abstract: A battery terminal which implements an electronically controlled vehicle electrical system coupling-disconnecting functionality including an electronically controlled power distribution, the battery terminal including a number of switching elements, of which at least some are connected to one another in a star point shape, the star-point connection being provided to be connected to a positive pole of a voltage source.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: April 5, 2022
    Assignee: Robert Bosch GmbH
    Inventors: Georg Schill, Andre Owerfeldt, Basti Anil Shenoy, Britta Kronenberg, Gita Woite, Juergen Motz, Marco Beckmann, Matthias Zabka, Nils Draese, Slava Tihovsky, Timo Lothspeich
  • BATTERY TERMINAL FOR A VEHICLE ELECTRICAL SYSTEM
    Publication number: 20200339051
    Abstract: A battery terminal which implements an electronically controlled vehicle electrical system coupling-disconnecting functionality including an electronically controlled power distribution, the battery terminal including a number of switching elements, of which at least some are connected to one another in a star point shape, the star-point connection being provided to be connected to a positive pole of a voltage source.
    Type: Application
    Filed: January 16, 2019
    Publication date: October 29, 2020
    Inventors: Georg Schill, Andre Owerfeldt, Basti Anil Shenoy, Britta Kronenberg, Gita Woite, Juergen Motz, Marco Beckmann, Matthias Zabka, Nils Draese, Slava Tihovsky, Timo Lothspeich
  • Method and apparatus for the analysis of scratches on semiconductor wafers
    Patent number: 6944573
    Abstract: For the analysis of scratches on semiconductor wafers, the semiconductor wafer surface is detected and a possible scratch position or a scratch course on the semiconductor surface is determined, in which case a parameter value identifying the scratch is determined from the scratch position and the scratch course and this parameter value that has been determined is correlated with comparison parameter values, which identify installation-specific scratch positions and scratch courses, in order to determine an installation causing the scratch.
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: September 13, 2005
    Assignee: Infineon Technologies AG
    Inventors: Ingo Brasack, Marco Beckmann
  • Method and apparatus for the analysis of scratches on semiconductor wafers
    Publication number: 20040220754
    Abstract: For the analysis of scratches on semiconductor wafers, the semiconductor wafer surface is detected and a possible scratch position or a scratch course on the semiconductor surface is determined, in which case a parameter value identifying the scratch is determined from the scratch position and the scratch course and this parameter value that has been determined is correlated with comparison parameter values, which identify installation-specific scratch positions and scratch courses, in order to determine an installation causing the scratch.
    Type: Application
    Filed: December 18, 2003
    Publication date: November 4, 2004
    Inventors: Ingo Brasack, Marco Beckmann