Abstract: The disclosure relates to a scan chain circuit comprising cascaded flip-flops having a functional input node and a test input node configured to be selectively coupled to logic circuitry at a clock edge time. A clock line is provided configured to distribute one or more clock signals to the flip-flops in the chain, wherein the flip-flops in the chain have active clock edges applied thereto at respective clock edge times. The chain of flip-flops comprise a set of flip-flops configured to receive an edge inversion signal and to selectively invert their active clock edges in response to the edge inversion signal being asserted.

Abstract: A random access memory (RAM) includes an array of arranged in rows and columns. The rows of the storage elements correspond to respective memory locations of the RAM. The storage elements of a row have a common gated-clock input and respective data inputs, and each row of the array of storage elements includes a plurality of D type latches. In operation, an address input of the RAM receives a memory address identifying a memory location in the RAM. Clock gating circuitry of the RAM, generates respective gated-clock signals for the rows of the array of storage elements based on the memory address received at the address input. Memory operation are performed using storage elements of the array based on the gated-clock signals.

Abstract: The disclosure relates to a scan chain circuit comprising cascaded flip-flops having a functional input node and a test input node configured to be selectively coupled to logic circuitry at a clock edge time. A clock line is provided configured to distribute one or more clock signals to the flip-flops in the chain, wherein the flip-flops in the chain have active clock edges applied thereto at respective clock edge times. The chain of flip-flops comprise a set of flip-flops configured to receive an edge inversion signal and to selectively invert their active clock edges in response to the edge inversion signal being asserted.

Abstract: The disclosure relates to a scan chain circuit comprising cascaded flip-flops having a functional input node and a test input node configured to be selectively coupled to logic circuitry at a clock edge time. A clock line is provided configured to distribute one or more clock signals to the flip-flops in the chain, wherein the flip-flops in the chain have active clock edges applied thereto at respective clock edge times. The chain of flip-flops comprise a set of flip-flops configured to receive an edge inversion signal and to selectively invert their active clock edges in response to the edge inversion signal being asserted.

Abstract: A system includes a controller configured for executing the test of the digital circuit, a memory configured for storing a status of the digital circuit, and a state machine configured for controlling, before the execution of the test, the storage into the memory of the status of the digital circuit and configured for controlling, after the execution of the test, restoring the status of the digital circuit based on the status stored in the memory.

Abstract: An electrical interconnection integrated device is described, comprising: a plurality of electrical terminals connectable to an integrated electronic circuit on a chip common to said interconnection device; at least an inside electrical device provided with a respective input connected to a first terminal of said plurality and a respective output; a fault detecting logic module having a first input connected to said output of the inner electrical device and provided with a detecting terminal for supplying a fault detecting signal.

Abstract: A shared diagnosis method may be for an electronic integrated system embedding a plurality of memory units associated with Built In Self Test (BIST) hardware portions for executing a test on memory locations of the memory units. A FAIL signal may be provided from the hardware portions, together with the memory locations of the memory units on which the test is executed. The method may include loading of address, state and data signals, generated during the test on the memory locations, in a series of bitmapping registers and supplied by multiplexer devices, which receive as inputs the address, state, and data signals from the memory units and from the hardware portions. The enabling for the loading of the bitmapping registers is through the processing of a Fail signal in a counter supplied by a multiplexer device receiving the Fail signals from the hardware portions.

Abstract: A system performs the test of a digital circuit. The system comprises a controller configured for executing the test of the digital circuit, a memory configured for storing a status of the digital circuit, and a state machine configured for controlling, before the execution of the test, the storage into the memory of the status of the digital circuit and configured for controlling, after the execution of the test, the restore into the digital circuit of the status stored into the memory.

Abstract: An electrical interconnection integrated device is described, comprising: a plurality of electrical terminals connectable to an integrated electronic circuit on a chip common to said interconnection device; at least an inside electrical device provided with a respective input connected to a first terminal of said plurality and a respective output; a fault detecting logic module having a first input connected to said output of the inner electrical device and provided with a detecting terminal for supplying a fault detecting signal.

Abstract: An asynchronous set-reset circuit device for testing activity performed by an Automatic Test Patterns Generation tool may include a pair of logic gates having at least two inputs each, and a logic gate structure coupled upstream from the pair of logic gates. The logic gate structure may be for driving one respective input of the pair of logic gates and may have inputs receiving a pair of test command signals. The asynchronous set-reset circuit device may also include a plurality of feedback connections between outputs of the pair of logic gates and respective inputs of the logic gate structure.

Abstract: A scan chain architecture includes a cascade of flip-flop cells each having at least one input and output or an inverted output. The output or inverted output of a flip-flop is connected to the input of the subsequent flip-flop. The connection between two consecutive flip-flops of the scan chain is selected according to the status of a given flip-flop cell, the status of a previous cell, and the status of the connection between these cells.

Abstract: A scan compression architecture for a design for a testability compiler used in system-on-chip software design tools includes a first scan architecture including a first scan compressor/decompressor configuration connected to a first predetermined set of pins, and a second scan architecture including a second scan compressor/decompressor configuration connected to a subset of the pins. The first scan architecture is selectively enabled for executing a scan test with a low time. The second scan architecture is for executing a scan test with high parallelism.

Abstract: A shared diagnosis method may be for an electronic integrated system embedding a plurality of memory units associated with Built In Self Test (BIST) hardware portions for executing a test on memory locations of the memory units. A FAIL signal may be provided from the hardware portions, together with the memory locations of the memory units on which the test is executed. The method may include loading of address, state and data signals, generated during the test on the memory locations, in a series of bitmapping registers and supplied by multiplexer devices, which receive as inputs the address, state, and data signals from the memory units and from the hardware portions. The enabling for the loading of the bitmapping registers is through the processing of a Fail signal in a counter supplied by a multiplexer device receiving the Fail signals from the hardware portions.

Abstract: A scan chain architecture includes a cascade of flip-flop cells each having at least one input and output or an inverted output. The output or inverted output of a flip-flop is connected to the input of the subsequent flip-flop. The connection between two consecutive flip-flops of the scan chain is selected according to the status of a given flip-flop cell, the status of a previous cell, and the status of the connection between these cells.

Abstract: An asynchronous set-reset circuit device for testing activity performed by an Automatic Test Patterns Generation tool may include a pair of logic gates having at least two inputs each, and a logic gate structure coupled upstream from the pair of logic gates. The logic gate structure may be for driving one respective input of the pair of logic gates and may have inputs receiving a pair of test command signals. The asynchronous set-reset circuit device may also include a plurality of feedback connections between outputs of the pair of logic gates and respective inputs of the logic gate structure.

Abstract: A scan compression architecture for a design for testability compiler used in system-on-chip software design tools includes a first scan architecture including a first scan compressor/decompressor configuration connected to a first predetermined set of pins, and a second scan architecture including a second scan compressor/decompressor configuration connected to a subset of the pins. The first scan architecture is selectively enabled for executing a scan test with a low time. The second scan architecture is for executing a scan test with high parallelism.

Abstract: An integrated device including a functional circuitry and a built-in self testing circuit for executing a structured test on the functional circuitry is proposed. The functional circuitry includes means for receiving input test values from the built-in self testing circuit and returning output test values to the built-in self testing circuit. In the solution of the invention, the built-in self testing circuit includes a memory for storing starting test values and expected test values, means for generating the input test values according to the starting test values, and means for determining a result of the structured test according to a comparison between the output test values and the expected test values.

Abstract: An integrated device including a functional circuitry and a built-in self testing circuit for executing a structured test on the functional circuitry is proposed. The functional circuitry includes means for receiving input test values from the built-in self testing circuit and returning output test values to the built-in self testing circuit. In the solution of the invention, the built-in self testing circuit includes a memory for storing starting test values and expected test values, means for generating the input test values according to the starting test values, and means for determining a result of the structured test according to a comparison between the output test values and the expected test values.