Abstract: A circuit arrangement, system, and method to test a device with a plurality of pins for electric overstress and transient induced latch-up characteristics. The circuit arrangement includes an inverting operational amplifier with a unity gain to receive a triggering signal and supply an inverted signal to a power amplifier. The power amplifier transforms the inverted signal into a test signal, which is received by a ratio circuit. The test signal is further operable to test the electric overstress and transient induced latch-up characteristics of the device. The ratio circuit transforms the test signal into a ratio signal. The ratio signal has a voltage magnitude that corresponds to the current magnitude of the test signal. The test signal and ratio signal are measured to determine if, during testing, the device or a component of the device has failed.

Abstract: Systems and methods for testing an integrated circuit device using transmission path and charged device model electrostatic discharge testing. The method includes measuring a electrostatic discharge signal from a charged transmission path of the system, measuring a electrostatic discharge signal from the charged transmission path of the system and a charged integrated circuit device coupled with the charged transmission path, and determining a charged device model waveform based upon distinctions between these electrostatic discharge signals.

Abstract: A system, probe interface, and method to test an integrated circuit with an electrostatic discharge signal. The probe interface includes a pulse generation circuit, ground plane, and a relay matrix, while the integrated circuit includes a plurality of contact points. The probe interface is configured proximate to the integrated circuit and the relay matrix is configured to electrically connect at least one of an operative signal, the pulse generation circuit, or the ground plane to a contact point of the integrated circuit. The probe interface is thus configured to provide a shortened path for at least one of the electrostatic discharge signal from the probe interface to the integrated circuit, or to the ground plane from the integrated circuit. The probe interface may selectively electrically connect to up to about thirty-two contact points of the integrated circuit, while the system may include up to about four probe interfaces.

Abstract: A circuit arrangement, system, and method to test a device with a plurality of pins for electric overstress and transient induced latch-up characteristics. The circuit arrangement includes an inverting operational amplifier with a unity gain to receive a triggering signal and supply an inverted signal to a power amplifier. The power amplifier transforms the inverted signal into a test signal, which is received by a ratio circuit. The test signal is further operable to test the electric overstress and transient induced latch-up characteristics of the device. The ratio circuit transforms the test signal into a ratio signal. The ratio signal has a voltage magnitude that corresponds to the current magnitude of the test signal. The test signal and ratio signal are measured to determine if, during testing, the device or a component of the device has failed.

Abstract: Encapsulated switches are disclosed which substitute non-toxic gallium alloy for mercury. In one embodiment, wetting of the interior surfaces of the housing is prevented by coating the surfaces with an electrically insulative inorganic non-metallic material, such as alumina or boron nitrate. According to another embodiment, a perfluorocarbon liquid is employed as the anti-wetting agent.

Abstract: A tunable optical fiber has a grating which is attached to an expander responsive to an external control including a temperature or a magnetic field. The expander changes length, and this is coupled to the optical fiber, which changes pitch, thereby accomplishing a tuning change. The expander may be coupled to the grating directly, or through an expansion reducer, which produces a greater range of tuning. Terfenol-D™ may be used for the expander material, and tubes which include a bonding point adjacent to the extents of the grating may form the extent reducers.