Abstract: A memory architecture includes a memory including a Command Set, and a serial peripheral interface (SPI) for connecting the memory to a generic host device. The SPI includes a data in line for supplying output data from the host device to inputs of the memory; a data out line for supplying output data from the memory to input of the host device; a clock line driven by the host device; and an enable line that allows the memory to be turned on and off by the host device. The memory is a NAND Flash Memory. The SPI includes an I/O registers block, including an SPI label register and a data register for driving separately data, commands and addresses directed to the memory from the corresponding SPI label registers.

Abstract: A removable storage device includes a substrate whereon a plurality of components are arranged. Advantageously, the removable storage device comprises a casing of the package type suitable to completely cover these components and to form, together with the substrate, an external coating of the removable storage device. Moreover, a method is described for assembling at least one removable storage device thus realized.

Abstract: A method of managing fails in a non-volatile memory device including an array of cells grouped in blocks of data storage cells includes defining in the array a first subset of user addressable blocks of cells, and a second subset of redundancy blocks of cells. A third subset of non-user addressable blocks of cells is defined in the array for storing the bad block address table of respective codes in an addressable page of cells of a block of the third subset. Each page of the third subset is associated to a corresponding redundancy block. If during the working life of the memory device a block of cells previously judged good in a test phase becomes failed, each block is marked as bad and the stored table in the random access memory is updated.

Abstract: A boot method for a data control unit downloads boot information from a nonvolatile memory into a temporary buffer of a boot-activation unit. A processing unit is activated by the boot-activation unit; a boot code is executed by the processing unit; and an operating code is downloaded from the nonvolatile memory into a volatile memory through the boot-activation unit. To correct possible errors in the block of the nonvolatile memory containing information and boot codes, the boot-activation unit verifies whether the boot information downloaded into its volatile memory has a critical-error condition and activates a spare memory portion of the nonvolatile memory in presence of the critical-error condition.

Abstract: A memory architecture includes a memory including a Command Set, and a serial peripheral interface (SPI) for connecting the memory to a generic host device. The SPI includes a data in line for supplying output data from the host device to inputs of the memory; a data out line for supplying output data from the memory to input of the host device; a clock line driven by the host device; and an enable line that allows the memory to be turned on and off by the host device. The memory is a NAND Flash Memory. The SPI includes an I/O registers block, including an SPI label register and a data register for driving separately data, commands and addresses directed to the memory from the corresponding SPI label registers.

Abstract: A method of managing fails in a non-volatile memory device including an array of cells grouped in blocks of data storage cells includes defining in the array a first subset of user addressable blocks of cells, and a second subset of redundancy blocks of cells. Each block including at least one failed cell in the first subset is located during a test on wafer of the non-volatile memory device. Each block is marked as bad, and a bad block address table of respective codes is stored in a non-volatile memory buffer. At power-on, the bad block address table is copied from the non-volatile memory buffer to the random access memory. A block of memory cells of the first subset is verified as bad by looking up the bad block address table, and if a block is bad, then remapping access to a corresponding block of redundancy cells.

Abstract: A removable storage device includes a substrate whereon a plurality of components are arranged. Advantageously, the removable storage device comprises a casing of the package type suitable to completely cover these components and to form, together with the substrate, an external coating of the removable storage device. Moreover, a method is described for assembling at least one removable storage device thus realized.

Abstract: A boot method for a data control unit downloads boot information from a nonvolatile memory into a temporary buffer of a boot-activation unit. A processing unit is activated by the boot-activation unit; a boot code is executed by the processing unit; and an operating code is downloaded from the nonvolatile memory into a volatile memory through the boot-activation unit. To correct possible errors in the block of the nonvolatile memory containing information and boot codes, the boot-activation unit verifies whether the boot information downloaded into its volatile memory has a critical-error condition and activates a spare memory portion of the nonvolatile memory in presence of the critical-error condition.

Abstract: In a storage system, a system controller is connected to an embedded storage device for supervising writing and reading operations in the embedded storage device. A data manager based upon a microprocessor is integrated in the embedded storage device and provides a high-level abstraction of the physical organization of the embedded storage device through the definition of an own logic map. The data manager is implemented outside the controller. The controller is formed in a first semiconductor material region, the embedded storage device is formed in a second semiconductor material region distinct from the first semiconductor material region, and the data manager is formed in a third semiconductor material region distinct from the first semiconductor material region.