Patents by Inventor Marco Spinetta

Marco Spinetta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for an improved checking of repeatability and reproducibility of a measuring chain for semiconductor device testing
    Patent number: 8928346
    Abstract: A method provides an improved checking of repeatability and reproducibility of a measuring chain, in particular for quality control by semiconductor device testing. The method includes testing steps provided for multiple and different devices to be subjected to measurement or control through a measuring system that includes at least one chain of measuring units between a testing apparatus (ATE) and each device to be subjected to measurement or control. Advantageously, the method comprises checking repeatability and reproducibility of each type of unit that forms part of the measuring chain and, after the checking, making a correlation between the various measuring chains as a whole to check repeatability and reproducibility, using a corresponding device subjected to measurement or control.
    Type: Grant
    Filed: April 22, 2011
    Date of Patent: January 6, 2015
    Assignees: STMicroelectronics S.r.l., STMicroelectronics (Grenoble 2) SAS
    Inventors: Sergio Tenucci, Alberto Pagani, Marco Spinetta, Bernard Ranchoux
  • METHOD FOR AN IMPROVED CHECKING OF REPEATABILITY AND REPRODUCIBILITY OF A MEASURING CHAIN FOR SEMICONDUCTOR DEVICE TESTING
    Publication number: 20110254580
    Abstract: A method provides an improved checking of repeatability and reproducibility of a measuring chain, in particular for quality control by semiconductor device testing. The method includes testing steps provided for multiple and different devices to be subjected to measurement or control through a measuring system that includes at least one chain of measuring units between a testing apparatus (ATE) and each device to be subjected to measurement or control. Advantageously, the method comprises checking repeatability and reproducibility of each type of unit that forms part of the measuring chain and, after the checking, making a correlation between the various measuring chains as a whole to check repeatability and reproducibility, using a corresponding device subjected to measurement or control.
    Type: Application
    Filed: April 22, 2011
    Publication date: October 20, 2011
    Applicants: STMICROELECTRONICS S.R.L., STMICROELECTRONICS (GRENOBLE) SAS
    Inventors: Sergio Tenucci, Alberto Pagani, Marco Spinetta, Bernard Ranchoux