Abstract: An assembly for characterizing a device under test (DUT) (2), comprising a dome (5) forming a test chamber. The assembly further comprises a plurality of sampling units (4), wherein during characterization of the DUT (2) the plurality of sampling units (4) are static with respect to the DUT (2) and the dome (5), and spatially distributed over the dome (5) in a far-field range of the DUT (2). The plurality of sampling units (4) are configured to receive a signal inside the test chamber, and transmit an output signal based on the received signal for further analysis. In a further aspect, a method for characterizing a DUT (2) is also provided.

Abstract: Load pull measurement arrangement having an active tuner with a signal generator providing a signal at a first frequency to a vector modulator. The vector modulator has an input for receiving control signals and is arranged to provide an injection signal at the first frequency based on the control signals. The active tuner further has a frequency multiplier receiving the injection signal and outputting a multiplied injection signal having a second frequency, the second frequency being an integer multiple of the first frequency. Furthermore, a millimeter wave extender has a frequency multiplier in the signal injection path connected to the device under test during operation.

Abstract: Load pull measurement arrangement having an active tuner with a signal generator providing a signal at a first frequency to a vector modulator. The vector modulator has an input for receiving control signals and is arranged to provide an injection signal at the first frequency based on the control signals. The active tuner further has a frequency multiplier receiving the injection signal and outputting a multiplied injection signal having a second frequency, the second frequency being an integer multiple of the first frequency. Furthermore, a millimeter wave extender has a frequency multiplier in the signal injection path connected to the device under test during operation.

Abstract: Device under test (DUT) interface device for use in a system for executing measurements on a device under test (9) with a vector network analyser (11). The DUT interface device comprises a divider/coupler component (4), a variable gain amplifier (5), an I/Q mixer (6) and a bridge/coupler component (7) and provides a test signal (a) to the DUT terminal (3). The system further comprises a control unit (12) connected to the vector network analyser (11) and to control input terminals (8) of associated ones of the at least one DUT interface device (1). The control unit (12) provides quadrature control signals (VI, VQ) for the associated at least one DUT interface device (1), which are connected directly to the device under test (9). The present invention further relates to proper calibration and measurement methods.