Abstract: An integrated circuit has a controllable switching element, the load path of which is arranged between an output of the integrated circuit and a supply potential. A test unit is connected to the connections of the switching element in order to carry out tests. A control unit is connected to the test unit via at least one control line. The sequence of tests is carried out dependent on signals on the control line(s). A memory is connected to the control unit the content and the type of which determines the time of the tests. The memory is connected to an input of the integrated circuit in order to enter the content.

Abstract: A device and a method test the connection of a load connected to a connection point. The connection point is formed between a first switching element, which is connected between a high supply voltage potential and the connection point, and a second switching element, which is connected between the connection point and a low supply voltage potential. When the two switching elements are switched off, a potential is built up at the connection point by at least one voltage or current source connected to the connection point. A potential analyzing circuit is provided and checks whether the potential lies in a defined potential range. If this is the case, it is concluded that a line between the connection point and the load has been interrupted.

Abstract: An integrated circuit has a controllable switching element, the load path of which is arranged between an output of the integrated circuit and a supply potential. A test unit is connected to the connections of the switching element in order to carry out tests. A control unit is connected to the test unit via at least one control line. The sequence of tests is carried out dependent on signals on the control line(s). A memory is connected to the control unit the content and the type of which determines the time of the tests. The memory is connected to an input of the integrated circuit in order to enter the content.

Abstract: A method for detecting the state of a load device which can be connected to a switching connection, wherein the switching connection can be coupled to, and decoupled from, a predefined switching potential. A voltage drop across the switching connection is used as a basis for detecting whether the load device is connected to the switching connection, the load device is not connected to the switching connection or there is a short circuit between the switching connection and a first or a second switching potential. An additional current source is connected to the switching connection at the same time as the switching connection is decoupled from the predefined switching potential.

Abstract: An integrated circuit has a control circuit (2) for a power field-effect transistor (3), wherein the integrated circuit has a first input (202) for receiving a control signal (CE) and an output to switch the field-effect transistor (3) on or off. The control circuit further has a driver circuit for providing a voltage level at the output in response of the control signal. A second input is provided for receiving a configuration signal, the configuration signal for configuring the voltage level being provided by the driver circuit in response to the control signal.

Abstract: An integrated circuit has a control circuit (2) for a power field-effect transistor (3), wherein the integrated circuit has a first input (202) for receiving a control signal (CE) and an output to switch the field-effect transistor (3) on or off. The control circuit further has a driver circuit for providing a voltage level at the output in response of the control signal. A second input is provided for receiving a configuration signal, the configuration signal for configuring the voltage level being provided by the driver circuit in response to the control signal.

Abstract: A method for detecting the state of a load device which can be connected to a switching connection, wherein the switching connection can be coupled to, and decoupled from, a predefined switching potential. A voltage drop across the switching connection is used as a basis for detecting whether the load device is connected to the switching connection, the load device is not connected to the switching connection or there is a short circuit between the switching connection and a first or a second switching potential. An additional current source is connected to the switching connection at the same time as the switching connection is decoupled from the predefined switching potential.