Patents by Inventor Marcos Kirsch

Marcos Kirsch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10996268
    Abstract: Methods and measurements systems are disclosed relating to dynamic measurement prioritization by multiple software interfaces. A first software interface with a low priority may be conducting a first measurement on a device under test (DUT) through a driver connected to a measurement device. A second software interface with a higher priority may initiate a request to conduct a second measurement on the DUT. In response, the driver may automatically determine that the second software interface has a higher priority than the first software interface and may halt the first measurement and conduct the second measurement. The driver may notify the first software interface that its access to the measurement hardware has been revoked, and the first software interface may enter a monitoring mode to monitor the results of the second measurement.
    Type: Grant
    Filed: April 4, 2018
    Date of Patent: May 4, 2021
    Assignee: National Instruments Corporation
    Inventors: Kunal Patel, Tobias Gordon, Laura Nayman, Marcos Kirsch, Reid Lee, Tyler Healy
  • Publication number: 20190310318
    Abstract: Methods and measurements systems are disclosed relating to dynamic measurement prioritization by multiple software interfaces. A first software interface with a low priority may be conducting a first measurement on a device under test (DUT) through a driver connected to a measurement device. A second software interface with a higher priority may initiate a request to conduct a second measurement on the DUT. In response, the driver may automatically determine that the second software interface has a higher priority than the first software interface and may halt the first measurement and conduct the second measurement. The driver may notify the first software interface that its access to the measurement hardware has been revoked, and the first software interface may enter a monitoring mode to monitor the results of the second measurement.
    Type: Application
    Filed: April 4, 2018
    Publication date: October 10, 2019
    Inventors: Kunal Patel, Tobias Gordon, Laura Nayman, Marcos Kirsch, Reid Lee, Tyler Healy
  • Patent number: 8299798
    Abstract: A method of testing a relay set which includes mapping a relay set to an undirected graph indicative of a topology of the relay set and includes vertices indicative of channels of the relay set and edges extending between corresponding vertices indicative of relays. Values based on a characteristic of a relay of the relay set that corresponds to the respective edge of the undirected graph are stored. A plurality of candidate test paths for a relay-to-test that each connects a first input/output (I/O) channel and a second I/O channel, and includes the relay-to-test are identified. A total value for the edges of the candidate test paths is determined for each of the candidate test paths. The total values are compared to one another and a test path is determined for the relay-to-test based on the comparison.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: October 30, 2012
    Assignee: National Instruments Corporation
    Inventor: Marcos Kirsch
  • Publication number: 20110316544
    Abstract: A method of testing a relay set which includes mapping a relay set to an undirected graph indicative of a topology of the relay set and includes vertices indicative of channels of the relay set and edges extending between corresponding vertices indicative of relays. Values based on a characteristic of a relay of the relay set that corresponds to the respective edge of the undirected graph are stored. A plurality of candidate test paths for a relay-to-test that each connects a first input/output (I/O) channel and a second I/O channel, and includes the relay-to-test are identified. A total value for the edges of the candidate test paths is determined for each of the candidate test paths. The total values are compared to one another and a test path is determined for the relay-to-test based on the comparison.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 29, 2011
    Inventor: Marcos Kirsch