Patents by Inventor Marcus DIEM

Marcus DIEM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Active bimodal AFM operation for measurements of optical interaction
    Patent number: 12270827
    Abstract: The present invention relates to a method for measuring the dielectric properties of a sample with a scanning probe microscope. In particular, the invention relates to highly-localized optical imaging and spectroscopy on a sample surface using an atomic force microscope (AFM) probe mechanically driven at two oscillation frequencies, referred to herein as “active bimodal operation”, and a modulated source of electromagnetic radiation.
    Type: Grant
    Filed: April 9, 2020
    Date of Patent: April 8, 2025
    Assignee: ATTOCUBE SYSTEMS AG
    Inventors: Alexander A. Govyadinov, Florian Huth, Ivan Malovichko, Marcus Diem
  • Method for referencing a near-field measurement with drift and fluctuation correction
    Patent number: 11899041
    Abstract: The present invention relates to a method for referencing a near-field measurement, e.g. in a scanning probe microscope.
    Type: Grant
    Filed: July 16, 2021
    Date of Patent: February 13, 2024
    Assignee: ATTOCUBE SYSTEMS AG
    Inventors: Ivan Malovichko, Florian Huth, Alexander A. Govyadinov, Marcus Diem
  • METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUCTUATION CORRECTION
    Publication number: 20230280369
    Abstract: The present invention relates to a method for referencing a near-field measurement, e.g. in a scanning probe microscope.
    Type: Application
    Filed: July 16, 2021
    Publication date: September 7, 2023
    Inventors: Ivan Malovichko, Florian Huth, Alexander A. Govyadinov, Marcus Diem
  • ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION
    Publication number: 20220163559
    Abstract: The present invention relates to a method for measuring the dielectric properties of a sample with a scanning probe microscope. In particular, the invention relates to highly-localized optical imaging and spectroscopy on a sample surface using an atomic force microscope (AFM) probe mechanically driven at two oscillation frequencies, referred to herein as “active bimodal operation”, and a modulated source of electromagnetic radiation.
    Type: Application
    Filed: April 9, 2020
    Publication date: May 26, 2022
    Inventors: Alexander A. GOVYADINOV, Florian HUTH, Ivan MALOVICHKO, Marcus DIEM