Abstract: An image processing system, includes a processor, wherein the processor is configured to obtain image pixel data generated by an optical imaging system of a microscope, to perform deconvolution processing on the obtained image pixel data for generating deconvolved image pixel data, to perform denoising processing on the obtained image pixel data for generating denoised image pixel data, to obtain a sampling density based on which the image pixel data is generated by the optical imaging system, and to mix the deconvolved image pixel data and the denoised image pixel data for generating mixed image pixel data with a weighting dependent on the sampling density to change a ratio of the deconvolved image pixel data in relation to the denoised image pixel data when the sampling density exceeds an oversampling limit.

Abstract: A single-particle localization microscope, including an optical system configured to illuminate a sample region with a sequence of light patterns having spatially different distributions of illumination light adapted to cause a single particle located in the sample region to emit detection light, a detector configured to detect a sequence of intensities of the detection light emerging from the sample region in response to the sequence of illuminating light patterns, and a processor configured to determine, based on the sequence of intensities of the detection light, an arrangement of potential positions for locating the particle. The processor further illuminates the sample region with at least one subsequent light pattern, causes detection of at least one subsequent intensity, and decides, based on the at least one subsequent intensity of the detection light, which one of the multiple potential positions represents an actual position of the particle in the sample region.

Abstract: An image processing system, includes a processor, wherein the processor is configured to obtain image pixel data generated by an optical imaging system of a microscope, to perform deconvolution processing on the obtained image pixel data for generating deconvolved image pixel data, to perform denoising processing on the obtained image pixel data for generating denoised image pixel data, to obtain a sampling density based on which the image pixel data is generated by the optical imaging system, and to mix the deconvolved image pixel data and the denoised image pixel data for generating mixed image pixel data with a weighting dependent on the sampling density to change a ratio of the deconvolved image pixel data in relation to the denoised image pixel data when the sampling density exceeds an oversampling limit.

Abstract: A scanning device for scanning an object in a scanning microscope includes at least one scanning unit configured to two-dimensionally scan the object using a light beam. The scanning unit includes at least one deflection element configured to deflect a light beam impinging thereon. The deflection element is rotationally symmetric in shape. At least one rotation device is configured to rotate the scanning unit about an axis of rotation so as to allow for image field rotation.

Abstract: A device for detecting light includes a silicon photomultiplier (SiPM) comprising a detection area formed from an array of a plurality of single-photon avalanche diodes (SPADs). An optical system is configured to shape the light such that the detection area is covered as completely as possible with a light beam region of substantially constant intensity.

Abstract: A method for improving dynamic range of a device for detecting light includes providing at least two detection regions. The detection regions are each formed by an array of a plurality of single-photon avalanche diodes (SPADs) and the detection regions each comprise at least one signal output. A characteristic curve is determined for each of the detection regions. The characteristic curves are combined with one another and/or offset against one another in order to obtain a correction curve and/or a correction factor.

Abstract: A scanning device for scanning an object in a scanning microscope includes at least one scanning unit configured to two-dimensionally scan the object using a light beam. The scanning unit includes at least one deflection element configured to deflect a light beam impinging thereon. The deflection element is rotationally symmetric in shape. At least one rotation device is configured to rotate the scanning unit about an axis of rotation so as to allow for image field rotation.

Abstract: A device for detecting light includes a silicon photomultiplier (SiPM) comprising a detection area formed from an array of a plurality of single-photon avalanche diodes (SPADs). An optical system is configured to shape the light such that the detection area is covered as completely as possible with a light beam region of substantially constant intensity.

Abstract: A method for improving dynamic range of a device for detecting light includes providing at least two detection regions. The detection regions are each formed by an array of a plurality of single-photon avalanche diodes (SPADs) and the detection regions each comprise at least one signal output. A characteristic curve is determined for each of the detection regions. The characteristic curves are combined with one another and/or offset against one another in order to obtain a correction curve and/or a correction factor.

Abstract: A method for light-microscopy imaging of a sample structure (2, 34) is described, having the following steps: preparing the sample structure (2, 34) with markers that are transferrable into a state imageable by light microscopy, generating a sequence of individual-image data sets by sequential imaging of the sample structure (2, 34), in such a way that for each image, only a subset of the totality of the markers is in each case transferred into the state imageable by light microscopy, the markers of the respective subset having an average spacing from one another which is greater than the resolution limit of light-microscopy imaging which determines the extent of a light distribution representing one of the respectively imaged markers, generating at least two data blocks in which multiple successive individual-image data sets are respectively combined, superposing the individual-image data sets contained in the respective data block to yield a superposed-image data set, identifying an image offset between

Abstract: A device and a method for acquiring a microscopic image of a sample structure are described. An optic for imaging the sample structure and a reference structure is provided, as well as a drift sensing unit for sensing a drift of the sample structure relative to the optic on the basis of the imaged reference structure. The optic comprises a first sharpness plane for imaging the sample structure and at the same time a second sharpness plane, modifiable in location relative to the first sharpness plane, for imaging the reference structure.

Abstract: A microscopic device provides three-dimensional localization of point-like objects and includes two imaging optics, each configured to image a same point-like object located in an object space into two separate image spaces as a focused light distribution. Two detector units are respectively associated with the imaging optics and configured to capture an analyzable light spot in detection points of a detection surface disposed in the respective image space. Each imaging optics includes an optical device that orients the focused light distributions obliquely to a detection axis such that, taking into account the detection point correspondence, the two light spots shift in opposite directions based on a z-position of the point-like object. An evaluation unit brings the detection points of the two detection surfaces into mutual pairwise correspondence and analyzes the two light spots so as to ascertain a lateral x-y position and an axial z-position of the point-like object.

Abstract: An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.

Abstract: A sample retainer for a microscope is described, comprising a sample stage (32), a holder (34) arranged on the sample stage (32), a sample carrier (36), couplable to the holder (34), to which a sample is attachable, and an adjusting apparatus (44), engaging on the holder (34), with which with the sample carrier (36), together with the holder (34) to which the sample carrier (36) is coupled, is displaceable on the sample stage (32), relative to the objective (46), into a target position. A decoupling apparatus that decouples the sample carrier (36), arranged in the target position, from the holder (34) upon imaging of the sample through the objective (46) is provided.

Abstract: A microscopic device provides three-dimensional localization of point-like objects and includes two imaging optics, each configured to image a same point-like object located in an object space into two separate image spaces as a focused light distribution. Two detector units are respectively associated with the imaging optics and configured to capture an analyzable light spot in detection points of a detection surface disposed in the respective image space. Each imaging optics includes an optical device that orients the focused light distributions obliquely to a detection axis such that, taking into account the detection point correspondence, the two light spots shift in opposite directions based on a z-position of the point-like object. An evaluation unit brings the detection points of the two detection surfaces into mutual pairwise correspondence and analyzes the two light spots so as to ascertain a lateral x-y position and an axial z-position of the point-like object.

Abstract: A method for light-microscopy imaging of a sample structure (2, 34) is described, having the following steps: preparing the sample structure (2, 34) with markers that are transferrable into a state imageable by light microscopy, generating a sequence of individual-image data sets by sequential imaging of the sample structure (2, 34), in such a way that for each image, only a subset of the totality of the markers is in each case transferred into the state imageable by light microscopy, the markers of the respective subset having an average spacing from one another which is greater than the resolution limit of light-microscopy imaging which determines the extent of a light distribution representing one of the respectively imaged markers, generating at least two data blocks in which multiple successive individual-image data sets are respectively combined, superposing the individual-image data sets contained in the respective data block to yield a superposed-image data set, identifying an image offset between

Abstract: A device and a method for acquiring a microscopic image of a sample structure are described. An optic for imaging the sample structure and a reference structure is provided, as well as a drift sensing unit for sensing a drift of the sample structure relative to the optic on the basis of the imaged reference structure. The optic comprises a first sharpness plane for imaging the sample structure and at the same time a second sharpness plane, modifiable in location relative to the first sharpness plane, for imaging the reference structure.

Abstract: A method and a device for providing a predeterminable concentration of at least one component in a microscopic sample liquid medium are described. The device includes a feeding device for the at least one component. Measurement data are determined, measuring a predeterminable parameter using a microscopic method. The concentration of the at least one component is adjusted or controlled via the feeding device based on the basis of measurement data.

Abstract: A sample retainer for a microscope is described, comprising a sample stage (32), a holder (34) arranged on the sample stage (32), a sample carrier (36), couplable to the holder (34), to which a sample is attachable, and an adjusting apparatus (44), engaging on the holder (34), with which with the sample carrier (36), together with the holder (34) to which the sample carrier (36) is coupled, is displaceable on the sample stage (32), relative to the objective (46), into a target position. A decoupling apparatus that decouples the sample carrier (36), arranged in the target position, from the holder (34) upon imaging of the sample through the objective (46) is provided.

Abstract: A device for beam adjustment in an optical beam path, having at least two mutually independent light sources providing respective beams of a high or extremely high resolution microscope, the beams of the light sources superposed in a common illumination beam path. The device includes a calibration sample with the aid of which the pupil position and/or focal position of the beams can be checked. The device also includes a sample holder arranged to bring the calibration sample into and out of the common illumination beam path at the site or in the vicinity of an intermediate image. A corresponding method is described. In accordance with the device and method, it is possible to undertake the beam adjustment independently of the actual use, that is to say, in the case of a high resolution microscope, independently of the examination sample and/or the recording of images.