Abstract: Techniques for image processing and transformation are provided. A plurality of images and a plurality of maps are received, and a system of neural networks is trained based on the plurality of images and the plurality of maps. A first image is received, and a first map is generated by processing the first image using the system of neural networks.

Abstract: Techniques for image processing and transformation are provided. A plurality of images and a plurality of maps are received, and a system of neural networks is trained based on the plurality of images and the plurality of maps. A first image is received, and a first map is generated by processing the first image using the system of neural networks.

Abstract: A method for clustering time stamps in time series data includes receiving a one-dimensional array of ordered timestamps and an expected frequency; determining a set of time intervals; determining a first binary array that indicates whether each time interval in the set of time intervals is greater than or less than the expected frequency; determining a second binary array of differences between a corresponding pair of adjacent elements of the first binary array; appending an ith timestamp to one of a set of opening interval bounds, a set of closing interval bounds, or a set of isolated points; merging the set of set of opening interval bounds and the set of closing interval bounds into a set of cluster intervals ?; and outputting the set of cluster intervals and the set of isolated points.

Abstract: The present invention is directed to a tip calibration standard for characterizing the geometric and electrostatic properties of the probe tips of scanning probe microscopes comprising a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate and connected to a contact mounted on the substrate. The present invention is also directed to methods for using such a tip calibration standard in calibrating probe tips, computing tip geometry and electrostatic data, and determining the convolution function so that tip-surface interaction effects can be separated from scanning probe microscope surface image data.

Abstract: The present invention is directed to a tip calibration standard for characterizing the geometric and electrostatic properties of the probe tips of scanning probe microscopes comprising a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate and connected to a contact mounted on the substrate. The present invention is also directed to methods for using such a tip calibration standard in calibrating probe tips, computing tip geometry and electrostatic data, and determining the convolution function so that tip-surface interaction effects can be separated from scanning probe microscope surface image data.