Patents by Inventor Marcus Heidkamp

Marcus Heidkamp has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11281085
    Abstract: An illumination apparatus includes a first solid-state-based illumination module, a second solid-state-based illumination module, and a superposition unit, which couples first and the second luminescence radiation into an illumination beam path, in which said radiation is guided up to the end of the illumination beam path in order to illuminate a light modulator. A filter unit which filters light with a second color from the first luminescence radiation with a first color and from the second luminescence radiation such that light with the first and second color is present at the end of the illumination beam path.
    Type: Grant
    Filed: November 14, 2019
    Date of Patent: March 22, 2022
    Assignee: Carl Zeiss Jena GmbH
    Inventors: Marcus Heidkamp, Dirk Doering, Axel Krause, Peter Klopfleisch, Alexander Gratzke, Bryce Anton Moffat
  • Publication number: 20200159099
    Abstract: An illumination apparatus includes a first solid-state-based illumination module, a second solid-state-based illumination module, and a superposition unit, which couples first and the second luminescence radiation into an illumination beam path, in which said radiation is guided up to the end of the illumination beam path in order to illuminate a light modulator. A filter unit which filters light with a second color from the first luminescence radiation with a first color and from the second luminescence radiation such that light with the first and second color is present at the end of the illumination beam path.
    Type: Application
    Filed: November 14, 2019
    Publication date: May 21, 2020
    Inventors: Marcus HEIDKAMP, Dirk DOERING, Axel KRAUSE, Peter KLOPFLEISCH, Alexander GRATZKE, Bryce Anton MOFFAT
  • Patent number: 8654128
    Abstract: The invention is directed to a method and an arrangement for displaying residual errors of a function which is fitted to a set of points. In the prior art, the residual errors are displayed in a separate graph apart from the function graph so that it is difficult for an observer to discern the quality of the fit of the function to the data points. An improved method and an improved arrangement make it possible to visually assess the quality of the fit in a simple, accurate manner. According to the invention, visual codes are assigned to the fitted function or to the data points of the point set piecewise or pointwise depending on the residual errors, and the fitted function is displayed graphically at an interface, wherein the fitted function is displayed piecewise or pointwise in the form of the assigned visual codes. The invention is preferably used for raster image spectroscopy with laser scanning microscopes.
    Type: Grant
    Filed: September 16, 2008
    Date of Patent: February 18, 2014
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Marcus Heidkamp, Stephan Wagner-Conrad, Klaus Weisshart
  • Publication number: 20100214297
    Abstract: The invention is directed to a method and an arrangement for displaying residual errors of a function which is fitted to a set of points. In the prior art, the residual errors are displayed in a separate graph apart from the function graph so that it is difficult for an observer to discern the quality of the fit of the function to the data points. An improved method and an improved arrangement make it possible to visually assess the quality of the fit in a simple, accurate manner. According to the invention, visual codes are assigned to the fitted function or to the data points of the point set piecewise or pointwise depending on the residual errors, and the fitted function is displayed graphically at an interface, wherein the fitted function is displayed piecewise or pointwise in the form of the assigned visual codes. The invention is preferably used for raster image spectroscopy with laser scanning microscopes.
    Type: Application
    Filed: September 16, 2008
    Publication date: August 26, 2010
    Inventors: Marcus Heidkamp, Stephan Wagner-Conrad, Klaus Weisshart
  • Patent number: 7656583
    Abstract: A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.
    Type: Grant
    Filed: April 6, 2007
    Date of Patent: February 2, 2010
    Assignee: Carl Zeiss Microimaging GmbH
    Inventors: Michael Goelles, Ralf Netz, Marcus Heidkamp, Joerg-Michael Funk
  • Publication number: 20080130125
    Abstract: A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.
    Type: Application
    Filed: April 6, 2007
    Publication date: June 5, 2008
    Inventors: Michael Goelles, Ralf Netz, Marcus Heidkamp, Joerg-Michael Funk