Patents by Inventor Marcus J. C. De Jong

Marcus J. C. De Jong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron beam apparatus with dynamic focussing
    Patent number: 5003173
    Abstract: Notably for transmission measurements, an electron microscope utilizes a dynamic focussing imaging optical system so that the focussing is optimally adjusted according to scanning lines even when measurements are performed on tilted objects. To this end, the object is preferably scanned in a pattern of lines extending parallel to an object tilt axis. Any defocussing of the electron beam, occurring at the irradiating side due to the dynamic focussing, can also be instantaneously corrected.
    Type: Grant
    Filed: October 6, 1989
    Date of Patent: March 26, 1991
    Assignee: U.S. Philips Corporation
    Inventor: Marcus J. C. De Jong