Patents by Inventor Mareike Schlichting

Mareike Schlichting has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Continuous test flow method and apparatus
    Patent number: 7017429
    Abstract: A method for testing devices produced in front end lots involving loading a plurality of front end lots into a tester without requiring the tester to complete tests on a previous front end lot. A secondary lot of devices is unloaded from the tester, the secondary lot containing devices from a plurality of front end lots. The plurality of front-end lots may form a batch. In this case, a plurality of secondary lots unloaded from the tester could correspond to the front-end lots, and could be considered to be part of the same batch. All secondary lots of the batch, except for the last secondary lot of the batch, may contain only pass devices, such that all fail devices from the batch are unloaded and then tested together, in the last secondary lot. The loading of the front-end lots may be asynchronous with the unloading of the secondary lots.
    Type: Grant
    Filed: April 30, 2003
    Date of Patent: March 28, 2006
    Assignees: Infineon Technologies Richmond, LP, Infineon Technologies AG
    Inventors: Joerg Schuntermann, Markus Sickmoeller, Franz Brosi, Mareike Schlichting
  • Continuous test flow method and apparatus
    Publication number: 20040216537
    Abstract: A method for testing devices produced in front end lots involving loading a plurality of front end lots into a tester without requiring the tester to complete tests on a previous front end lot. A secondary lot of devices is unloaded from the tester, the secondary lot containing devices from a plurality of front end lots. The plurality of front-end lots may form a batch. In this case, a plurality of secondary lots unloaded from the tester could correspond to the front-end lots, and could be considered to be part of the same batch. All secondary lots of the batch, except for the last secondary lot of the batch, may contain only pass devices, such that all fail devices from the batch are unloaded and then tested together, in the last secondary lot. The loading of the front-end lots may be asynchronous with the unloading of the secondary lots.
    Type: Application
    Filed: April 30, 2003
    Publication date: November 4, 2004
    Applicant: Infineon Technologies Richmond, LP
    Inventors: Joerg Schuntermann, Markus Sickmoeller, Franz Brosi, Mareike Schlichting