Abstract: A system for acquisition of tomographic measurement data from measurement signals (S) of positron emission tomography (PET) or single-photon emission computed tomography (SPECT) detectors, the system comprising: a front-end electronic assembly (2) configured to convert the measurement signals (S) into digital and analog signals (DAS); a measurement electronics assembly (3) comprising time to digital converter (TDC) modules (31) configured to determine times (T) of pulses in digital signals (DS).

Abstract: A method for measuring parameters of an analog signal to determine times at which the analog signal (S) crosses predetermined voltage thresholds (VA, VB, VC, VD), the method comprising the steps of: splitting the analog signal (S) into a number of interim signals (SA, SB, SC, SD), the number of the interim signals corresponding to the number of the preset voltage thresholds (VA, VB, VC, VD); providing an FPGA system (10) comprising differential buffers (11 A, 11 B, 11 C, 11 D) with outputs connected to a number of sequences (20A, 20B, 20C, 20D) of delay elements (21, 22, 23), the number of sequences of delay elements corresponding to the number of the preset voltage thresholds (VA, VB, VC, VD); inputting, to an input of each differential buffer (11 A, 11 B, 11 C, 11 D), one interim signal (SA, SB, SC, SD) and a reference voltage corresponding to a particular preset voltage threshold (VA, VB, VC, VD); reading, by means of vector generators (31 A, 31 B, 31 C, 31 D), assigned separately to each of the sequences

Abstract: A system for acquisition of tomographic measurement data from measurement signals (S) of positron emission tomography (PET) or single-photon emission computed tomography (SPECT) detectors, the system comprising: a front-end electronic assembly (2) configured to convert the measurement signals (S) into digital and analog signals (DAS); a measurement electronics assembly (3) comprising time to digital converter (TDC) modules (31) configured to determine times (T) of pulses in digital signals (DS).

Abstract: A method for measuring parameters of an analog signal to determine times at which the analog signal (S) crosses pre-determined voltage thresholds (VA, VB, VC, VD), the method comprising the steps of: splitting the analog signal (S) into a number of interim signals (SA, SB, SC, SD), the number of the interim signals corresponding to the number of the preset voltage thresholds (VA, VB, VC, VD); providing an FPGA system (10) comprising differential buffers (11A, 11B, 11C, 11D) with outputs connected to a number of sequences (20A, 20B, 20C, 20D) of delay elements (21, 22, 23), the number of sequences of delay elements corresponding to the number of the preset voltage thresholds (VA, VB, VC, VD); inputting, to an input of each differential buffer (11A, 11B, 11C, 11D), one interim signal (SA, SB, SC, SD) and a reference voltage corresponding to a particular preset voltage threshold (VA, VB, VC, VD); reading, by means of vector generators (31A, 31B, 31C, 31D), assigned separately to each of the sequences (20A, 20B,