Patents by Inventor Margaret H. Wang

Margaret H. Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tuning a test trace configured for capacitive coupling to signal traces
    Patent number: 7394260
    Abstract: A method of tuning a test trace that is capacitively coupled to a number of signal traces. A method for determining a configuration of a device comprising signal traces and a capacitively coupled test trace may include selecting a test frequency of a test signal to be driven on selected signal traces during a test mode of device operation, and tuning circuit characteristics of the test trace to generate a bandpass frequency response including a passband and a stopband, where a detection frequency corresponding either to the test frequency or a selected harmonic of the test frequency is included in the passband. Tuning of circuit characteristics may include selecting a degree of capacitive coupling between the test trace and the signal traces such that, within a specified constraint for signal degradation on the signal traces, the bandpass frequency response of the given test trace satisfies a specified transmission requirement at the detection frequency.
    Type: Grant
    Filed: May 24, 2006
    Date of Patent: July 1, 2008
    Assignee: Sun Microsystems, Inc.
    Inventors: Margaret H. Wang, Prabhansu Chakrabarti
  • Tuning a test trace configured for capacitive coupling to signal traces
    Publication number: 20070273386
    Abstract: A method of tuning a test trace that is capacitively coupled to a number of signal traces. A method for determining a configuration of a device comprising signal traces and a capacitively coupled test trace may include selecting a test frequency of a test signal to be driven on selected signal traces during a test mode of device operation, and tuning circuit characteristics of the test trace to generate a bandpass frequency response including a passband and a stopband, where a detection frequency corresponding either to the test frequency or a selected harmonic of the test frequency is included in the passband. Tuning of circuit characteristics may include selecting a degree of capacitive coupling between the test trace and the signal traces such that, within a specified constraint for signal degradation on the signal traces, the bandpass frequency response of the given test trace satisfies a specified transmission requirement at the detection frequency.
    Type: Application
    Filed: May 24, 2006
    Publication date: November 29, 2007
    Applicant: Sun Microsystems, Inc.
    Inventors: Margaret H. Wang, Prabhansu Chakrabarti