Abstract: A method for predicting time-to-failure and remaining-life of an electrical power system asset includes analyzing characteristics of the power system asset over a specified time interval; based on the analysis, associating the power system asset with a pool of similar power system assets having similar historical performance characteristics; and based on the association, calculating time-to-failure and remaining-life probability factors for the power system asset. A computer program product is also provided for carrying out the method, and the method may further include a mechanism whereby the computer program learns ways to modify and enhance the analysis of the performance characteristics to provide for higher confidence levels in time-to-failure and remaining-life probability calculations.

Abstract: A test switch signal analyzer comprising: an analyzer hub operably couplable to a test switch base that includes test switch conductors; signal probe(s) couplable to the analyzer hub and to the plurality of test switch conductors when the analyzer hub is coupled to the test switch base, a signal processing unit coupled to the analyzer hub; the signal processing unit, the analyzer hub, and at least a portion of the at least one signal probe being positionable within a test switch cover that mates with the test switch base when the signal probe is coupled to the test switch conductor(s) and the test switch cover is secured to the test switch base.

Abstract: A mounting mechanism comprising: a first end and a second end; and a shaft extending from the first end to the second end, the shaft including: a peripheral wall; threading extending along at least a portion of the peripheral wall of the shaft; a first port hole opening and a second port hole opening; a through-hole extending from the first port hole opening to the second port hole opening to provide a via for wiring to pass within the shaft from the first port hole opening to the second port hole opening.

Abstract: A test switch signal analyzer comprising: an analyzer hub operably couplable to a test switch base that includes test switch conductors; signal probe(s) couplable to the analyzer hub and to the plurality of test switch conductors when the analyzer hub is coupled to the test switch base, a signal processing unit coupled to the analyzer hub; the signal processing unit, the analyzer hub, and at least a portion of the at least one signal probe being positionable within a test switch cover that mates with the test switch base when the signal probe is coupled to the test switch conductor(s) and the test switch cover is secured to the test switch base.

Abstract: A test switch signal analyzer comprising: an analyzer hub operably couplable to a test switch base that includes test switch conductors; signal probe(s) couplable to the analyzer hub and to the plurality of test switch conductors when the analyzer hub is coupled to the test switch base, a signal processing unit coupled to the analyzer hub; the signal processing unit, the analyzer hub, and at least a portion of the at least one signal probe being positionable within a test switch cover that mates with the test switch base when the signal probe is coupled to the test switch conductor(s) and the test switch cover is secured to the test switch base.

Abstract: A test switch signal analyzer comprising: an analyzer hub operably couplable to a test switch base that includes test switch conductors; signal probe(s) couplable to the analyzer hub and to the plurality of test switch conductors when the analyzer hub is coupled to the test switch base, a signal processing unit coupled to the analyzer hub; the signal processing unit, the analyzer hub, and at least a portion of the at least one signal probe being positionable within a test switch cover that mates with the test switch base when the signal probe is coupled to the test switch conductor(s) and the test switch cover is secured to the test switch base.