Patents by Inventor Mari Miyauchi

Mari Miyauchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6975502
    Abstract: A multilayer ceramic capacitor including an internal electrode layer, an internal dielectric layer having a thickness of less than 2 ?m, and an external dielectric layer is provided, wherein the internal dielectric layer and external dielectric layer contain a plurality of dielectric particles, and when assuming that an average particle diameter of the entire dielectric particles in the internal dielectric layer is D50a (unit: ?m), an average particle diameter of the entire dielectric particles existing at a position being away at least by 5 ?m from the outermost internal electrode layer in the thickness direction is D50b (unit: ?m), a ratio (D50a/D50b) of the D50a and D50b is y (no unit), standard deviation of a particle size distribution of the entire dielectric particles in the internal dielectric layer is ? (no unit), and a ratio that dielectric particles (coarse particles) having an average particle diameter of 2.
    Type: Grant
    Filed: March 31, 2005
    Date of Patent: December 13, 2005
    Assignee: TDK Corporation
    Inventors: Takako Murosawa, Mari Miyauchi, Kazunori Noguchi, Akira Sato
  • Publication number: 20050254197
    Abstract: A multilayer ceramic capacitor comprising an internal electrode layer and a dielectric layer having a thickness of less than 2 ?m is provided, wherein the dielectric layer contains a plurality of dielectric particles, and when it is assumed that standard deviation of a particle distribution of the entire dielectric particles in the dielectric layer is ? (no unit), an average particle diameter of the entire dielectric particles in the dielectric layer is D50 (unit: ?m), and a rate that dielectric particles (coarse particles) having an average particle diameter of 2.25 times of the D50 exist in the entire dielectric particles is p (unit: %), the ? and p satisfy ?<0.130 and p<12%; by which a TC bias characteristic can be expected to be improved while maintaining various electric characteristics, particularly a sufficient permittivity, even when the interlayer dielectric layer is made thin.
    Type: Application
    Filed: March 30, 2005
    Publication date: November 17, 2005
    Applicant: TDK CORPORATION
    Inventors: Takako Murosawa, Mari Miyauchi, Kazunori Noguchi, Akira Sato
  • Publication number: 20050219795
    Abstract: A multilayer ceramic capacitor comprising an internal electrode layer, an internal dielectric layer having a thickness of less than 2 ?m, and an external dielectric layer is provided, wherein the internal dielectric layer and external dielectric layer contain a plurality of dielectric particles, and when assuming that an average particle diameter of the entire dielectric particles in the internal dielectric layer is D50a (unit: ?m), an average particle diameter of the entire dielectric particles existing at a position being away at least by 5 ?m from the outermost internal electrode layer in the thickness direction is D50b (unit: ?m), a ratio (D50a/D50b) of the D50a and D50b is y (no unit), standard deviation of a particle size distribution of the entire dielectric particles in the internal dielectric layer is ? (no unit), and a ratio that dielectric particles (coarse particles) having an average particle diameter of 2.
    Type: Application
    Filed: March 31, 2005
    Publication date: October 6, 2005
    Applicant: TDK CORPORATION
    Inventors: Takako Murosawa, Mari Miyauchi, Kazunori Noguchi, Akira Sato
  • Publication number: 20050180092
    Abstract: A multilayer ceramic capacitor 1 having internal electrode layers 3, internal dielectric layers 2 having the thickness of less than 2 ?m, and external dielectric layers 20 wherein; the internal dielectric layers 2 and the external dielectric layers 20 include a plural number of dielectric particles 2a, 20a, and when y1 is ratio(D50a/D50b) of D50a and D50b where D50a is an average particle size of dielectric particles 2a included in the internal dielectric layers 2 and D50b is an average particle size of dielectric particles 20a included in the external dielectric layer 20 and located at least 5 ?m away from an internal electrode layer 3a, arranged outermost part of all the internal electrode layers, to the stacked direction, and x is thickness of the internal dielectric layer 2, y1 and x satisfy the following equations, y1??0.75x+2.275 and y1??0.75x+1.675.
    Type: Application
    Filed: January 27, 2005
    Publication date: August 18, 2005
    Applicant: TDK Corporation
    Inventors: Takako Hibi, Kazunori Noguchi, Mari Miyauchi, Akira Sato
  • Patent number: 6930876
    Abstract: A multilayer ceramic capacitor 1 having internal electrode layers 3 and internal dielectric layers 2 having thickness of at most 3.5 ?m wherein; the internal dielectric layers 2 comprising dielectric particles contacting the internal electrode layers (contacting dielectric particles 2a) and dielectric particles not contacting the internal electrode layers (non-contacting dielectric particles 2b), and when an average particle size of an entire plural number of dielectric particles included in the internal dielectric layers 2 is D50, and standard deviation for particle size range of the contacting dielectric particles is ?, the multilayer ceramic capacitor satisfy the following equations; D50?0.25 ?m and ??0.14. According to the present invention, multilayer ceramic capacitor 1 is provided wherein the capacitor is expected to have improved DC bias characteristic even when the internal dielectric layers 2 are made thinner.
    Type: Grant
    Filed: January 27, 2005
    Date of Patent: August 16, 2005
    Assignee: TDK Corporation
    Inventors: Kazunori Noguchi, Takako Hibi, Mari Miyauchi, Akira Sato
  • Publication number: 20050152095
    Abstract: The invention aims to provide a multilayer ceramic capacitor with high dielectric constant, a high capacitance, and an excellent reliability by eliminating oxygen vacancy in dielectric layers and suppressing oxidation of Ni inner electrodes. The multilayer ceramic capacitor comprises a multilayered dielectric body composed by alternately piling up dielectric layers containing mainly barium titanate and inner electrode layers containing mainly Ni and a first hetero-phase containing Mg—Si—O as constituent elements exists in the capacitor.
    Type: Application
    Filed: January 7, 2005
    Publication date: July 14, 2005
    Applicant: TDK Corporation
    Inventors: Yukie Nakano, Mari Miyauchi, Akira Sato
  • Publication number: 20050117274
    Abstract: There is provided a multilayer ceramic capacitor 1, having an internal electrode layer 3 and an interlayer dielectric layer 2 having a thickness of 3.5 ?m or less, wherein the interlayer dielectric layer 2 is composed of contact dielectric particles 2a contacting said internal electrode layer and noncontact dielectric particles 2b not contacting said internal electrode layer; and when assuming that an average particle diameter of the contact dielectric particles 2a is D50e and an average particle diameter of the noncontact dielectric particles 2b is D50d, D50e<0.450 ?m and (D50e/D50d)=1.20 to 3.00 (note that 1.20 and 3.00 are excluded) are satisfied, wherein an improvement of a bias characteristic at 85° C. can be expected even when the interlayer dielectric layer 2 is made thin.
    Type: Application
    Filed: November 26, 2004
    Publication date: June 2, 2005
    Applicant: TDK CORPORATION
    Inventors: Mari Miyauchi, Kazunori Noguchi, Takako Hibi, Akira Sato
  • Publication number: 20050111163
    Abstract: In order to provide dielectric ceramic composition having low IR defect rate and high relative dielectric constant even when the multilayer ceramic capacitor is made thinner, dielectric ceramic composition including a main component expressed by a composition formula {{Ba(1-x)Cax}O}A{Ti(1-y-z)ZryMgz}BO2 and subcomponents of Mn oxide, Y oxide, V oxide and Si oxide is provided. In the above formula, A, B, x , y and z are as follows: 0.995?A/B?1.020, 0.0001?x?0.07, preferably 0.001?x?0.05, 0.1?y?0.3 and 0.0005?z?0.0 1, preferably 0.003?z?0.0 1.
    Type: Application
    Filed: September 29, 2004
    Publication date: May 26, 2005
    Applicant: TDK Corporation
    Inventors: Kazushige Ito, Shunichi Yuri, Yukie Nakano, Mari Miyauchi, Takako Hibi, Daisuke Iwanaga, Masakazu Hosono
  • Patent number: 6785121
    Abstract: A multilayer ceramic capacitor having internal electrode layers and dielectric layers with dielectric particles is disclosed. An average particle diameter of the dielectric particles, when measured parallel with the direction of the internal electrode layers, is larger than a thickness of the dielectric layer. A ratio (R/d) between the average particle diameter (R) and the thickness (d) of the dielectric layer is 1<R/d<3.
    Type: Grant
    Filed: May 29, 2001
    Date of Patent: August 31, 2004
    Assignee: TDK Corporation
    Inventors: Yukie Nakano, Shunichi Yuri, Mari Miyauchi, Daisuke Iwanaga
  • Publication number: 20040051216
    Abstract: A method of producing a multilayer ceramic capacitor having internal electrode layers and dielectric layers with dielectric particles is disclosed. An average particle diameter of the dielectric particles, when measured parallel with the direction of the internal electrode layers, is larger than a thickness of the dielectric layer. A ratio (R/d) between the average particle diameter (R) and the thickness (d) of the dielectric layer is 1<R/d<3.
    Type: Application
    Filed: August 5, 2003
    Publication date: March 18, 2004
    Applicant: TDK CORPORATION
    Inventors: Yuki Nakano, Shunichi Yuri, Mari Miyauchi, Daisuke Iwanaga
  • Patent number: 6493207
    Abstract: The invention provides a multilayer ceramic capacitor capable of preventing the occurrence of cracks by inhibiting the multilayer capacitor from expanding in a stacking direction and a width direction. The multilayer ceramic capacitor includes a capacitor element (10) in which dielectric layers (11a and 11b) and internal electrodes (12) are alternately stacked. The capacitor element (10) is obtained by stacking and firing a dielectric paste layer and an internal electrode paste layer. An expansion coefficient x in the stacking direction lies between −0.05i% and 0.05i% inclusive, where i denotes the number of dielectric layers (11a), preferably the expansion coefficient x is 0% or less, or more preferably the expansion coefficient x lies between −10% and 0% inclusive. Preferably, an expansion coefficient y in the width direction lies between −0.05i% and 0% inclusive.
    Type: Grant
    Filed: June 26, 2001
    Date of Patent: December 10, 2002
    Assignee: TDK Corporation
    Inventors: Yukie Nakano, Takako Hibi, Mari Miyauchi, Daisuke Iwanaga
  • Publication number: 20020075632
    Abstract: A multilayer ceramic capacitor comprises internal electrode layers and dielectric layers. An average particle diameter (R), in a direction parallel with said internal electrode layer, in dielectric particles constituting said dielectric layers is larger than a thickness (d) of said dielectric layer. A ratio (R/d) between the average particle diameter (R) and the thickness (d) of the dielectric layer is 1<R/d<3.
    Type: Application
    Filed: May 29, 2001
    Publication date: June 20, 2002
    Applicant: TDK CORPORATION
    Inventors: Yukie Nakano, Shunichi Yuri, Mari Miyauchi, Daisuke Iwanaga
  • Publication number: 20010055192
    Abstract: Disclosed is a multilayer capacitor capable of preventing the occurrence of cracks by inhibiting the multilayer capacitor from expanding in a stacking direction and a width direction. The multilayer capacitor comprises a capacitor element (10) in which dielectric layers (11a and 11b) and internal electrodes (12) are alternately stacked. The capacitor element (10) is obtained by stacking and firing a dielectric paste layer and an internal electrode paste layer. An expansion coefficient x in the stacking direction lies between −0.05i % and 0.05i % inclusive, where i denotes the number of dielectric layers (11a), preferably the expansion coefficient x is 0% or less, or more preferably the expansion coefficient x lies between −10% and 0% inclusive. Preferably, an expansion coefficient y in the width direction lies between −0.05i % and 0% inclusive.
    Type: Application
    Filed: June 26, 2001
    Publication date: December 27, 2001
    Applicant: TDK CORPORATION
    Inventors: Yukie Nakano, Takako Hibi, Mari Miyauchi, Daisuke Iwanaga