Patents by Inventor Maria Giovanna Pretto

Maria Giovanna Pretto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Analytical method to measure nitrogen concentration in single crystal silicon
    Patent number: 6803576
    Abstract: The present invention is a method for quantitatively measuring nitrogen in Czochralski silicon based on the detection of one or more N—O complexes by means of low temperature Fourier Transform infrared spectroscopy (LT-FTIR) in the far infrared spectral range (FIR).
    Type: Grant
    Filed: September 23, 2002
    Date of Patent: October 12, 2004
    Assignee: MEMC Electronic Materials, SPA
    Inventors: Maria Giovanna Pretto, Maria Porrini, Roberto Scala, Vladimir Voronkov, Paolo Collareta, Robert J. Falster
  • Analytical method to measure nitrogen concentration in single crystal silicon
    Publication number: 20030068826
    Abstract: The present invention is a method for quantitatively measuring nitrogen in Czochralski silicon based on the detection of one or more N—O complexes by means of low temperature Fourier Transform infrared spectroscopy (LT-FTIR) in the far infrared spectral range (FIR).
    Type: Application
    Filed: September 23, 2002
    Publication date: April 10, 2003
    Inventors: Maria Giovanna Pretto, Maria Porrini, Roberto Scala, Vladimir Voronkov, Paolo Collareta, Robert J. Falster