Patents by Inventor Maria Nix, born Saxler

Maria Nix, born Saxler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for automatically measuring thickness of coatings on a substrate by comparison with an uncoated substrate
    Patent number: 4400665
    Abstract: Instrument for measuring thickness of coatings on substrate based on space-dependent, electromagnetic interaction between a measuring probe resting against the coating and the substrate comprising a compensating probe, a comparison body with properties similar to that of the substrate, a mechanism for adjusting the spacing of the compensating probe from the comparison body, until the same electromagnetic interaction is obtained as for the measuring probe and the substrate and a device for displaying the spacing between the compensating probe and comparison body.
    Type: Grant
    Filed: December 19, 1979
    Date of Patent: August 23, 1983
    Assignee: Norbert Nix
    Inventor: Maria Nix, born Saxler