Abstract: A nonlinear optical microscope is provided, including source of a pulsed laser beam; a spatial light modulator for modulating the spatial profile of the pulsed laser beam; an objective for guiding the modulated beam towards a slide intended to carry a specimen; and a detector for collecting signals originating from the specimen, wherein the spatial light modulator is designed to modulate the intensity and/or the phase of the pulsed laser beam on the rear pupil of the objective to produce a beam that is axially extended and confined in one or two lateral directions after focusing by the objective, and wherein the slide is placed on a motorized stage of a histology slide scanner assembly.

Abstract: A nonlinear optical microscope is provided, including source of a pulsed laser beam; a spatial light modulator for modulating the spatial profile of the pulsed laser beam; an objective for guiding the modulated beam towards a slide intended to carry a specimen; and a detector for collecting signals originating from the specimen, wherein the spatial light modulator is designed to modulate the intensity and/or the phase of the pulsed laser beam on the rear pupil of the objective to produce a beam that is axially extended and confined in one or two lateral directions after focusing by the objective, and wherein the slide is placed on a motorized stage of a histology slide scanner assembly.

Abstract: A method for the dimensional characterization of a structured material, in which method: an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of the structured material are deduced therefrom.

Abstract: A method for the dimensional characterization of a structured material, in which method: an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of the structured material are deduced therefrom.