Patents by Inventor Marijan Persun

Marijan Persun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring relative, within-die leakage current and/or providing a temperature variation profile using a leakage inverter and ring oscillator
    Patent number: 7193427
    Abstract: A leakage inverter has a switching delay in one direction that is directly proportional to the drain or gate leakage current of either an n-type or p-type device. For one aspect, a leakage ring oscillator includes an odd number of inverters including at least one leakage inverter such that the frequency of oscillation of the leakage ring oscillator is directly proportional to local device leakage. For another aspect, a leakage ring oscillator may be used to indicate temperature and/or temperature variation on a die.
    Type: Grant
    Filed: March 31, 2004
    Date of Patent: March 20, 2007
    Assignee: Intel Corporation
    Inventors: Marijan Persun, Samie B. Samaan
  • Method, apparatus and system of domino multiplexing
    Patent number: 7183807
    Abstract: Embodiments of the present invention provide a method, apparatus and system for domino multiplexing including sustaining a first domino block output in a preconditioning state using a second domino block output.
    Type: Grant
    Filed: June 30, 2004
    Date of Patent: February 27, 2007
    Assignee: Intel Corporation
    Inventors: Chayan Kumar Seal, Marijan Persun
  • Leakage tolerant register file
    Patent number: 7002855
    Abstract: A register file includes a dynamic local bit trace, a plurality of data cells coupled to the dynamic local bit trace, and a device coupled to the dynamic local bit trace to facilitate precharging the dynamic local bit trace to a precharge value and to intelligently hold the precharged value on the dynamic local bit trace during evaluation of the dynamic local bit trace.
    Type: Grant
    Filed: January 30, 2004
    Date of Patent: February 21, 2006
    Assignee: Intel Corporation
    Inventors: Sapumal Wijeratne, Pankaj Aswal, Mohammad M. Haq, Marijan Persun
  • Method, apparatus and system of domino multiplexing
    Publication number: 20060001450
    Abstract: Embodiments of the present invention provide a method, apparatus and system for domino multiplexing including sustaining a first domino block output in a preconditioning state using a second domino block output.
    Type: Application
    Filed: June 30, 2004
    Publication date: January 5, 2006
    Inventors: Chayan Seal, Marijan Persun
  • Leakage tolerant register file
    Publication number: 20050068827
    Abstract: A register file includes a dynamic local bit trace, a plurality of data cells coupled to the dynamic local bit trace, and a device coupled to the dynamic local bit trace to facilitate precharging the dynamic local bit trace to a precharge value and to intelligently hold the precharged value on the dynamic local bit trace during evaluation of the dynamic local bit trace.
    Type: Application
    Filed: January 30, 2004
    Publication date: March 31, 2005
    Inventors: Sapumal Wijeratne, Pankaj Aswal, Mohammad Haq, Marijan Persun
  • A METHOD AND APPARATUS FOR MEASURING LEAKAGE CURRENT AND/OR TEMPERATURE VARIATION
    Publication number: 20040263200
    Abstract: A leakage inverter has a switching delay in one direction that is directly proportional to the drain or gate leakage current of either an n-type or p-type device. For one aspect, a leakage ring oscillator includes an odd number of inverters including at least one leakage inverter such that the frequency of oscillation of the leakage ring oscillator is directly proportional to local device leakage. For another aspect, a leakage ring oscillator may be used to indicate temperature and/or temperature variation on a die.
    Type: Application
    Filed: June 30, 2003
    Publication date: December 30, 2004
    Inventors: Marijan Persun, Samie B. Samaan
  • Method and apparatus for measuring relative, within-die leakage current and/or providing a temperature variation profile using a leakage inverter and ring oscillator
    Publication number: 20040263192
    Abstract: A leakage inverter has a switching delay in one direction that is directly proportional to the drain or gate leakage current of either an n-type or p-type device. For one aspect, a leakage ring oscillator includes an odd number of inverters including at least one leakage inverter such that the frequency of oscillation of the leakage ring oscillator is directly proportional to local device leakage. For another aspect, a leakage ring oscillator may be used to indicate temperature and/or temperature variation on a die.
    Type: Application
    Filed: March 31, 2004
    Publication date: December 30, 2004
    Inventors: Marijan Persun, Samie B. Samaan