Abstract: An inspection station includes a conveyor, a first scanner, a second scanner, a controller, and an interface. The conveyor is configured to continuously transport a vehicle body through the station. The first scanner is configured to detect features of the vehicle body and associated feature coordinates relative to a global coordinate system. The second scanner is configured to detect paint thicknesses on surfaces of the vehicle body and associated paint thickness coordinates relative to the global coordinate system. The controller is programmed to map corresponding pairs of the feature coordinates and paint thickness coordinates into a single set of local coordinates having a datum defined by the vehicle body such that each of the local coordinates defines a location of one of the features relative to the datum and one of the paint thicknesses at the location. The interface is configured to display the features and corresponding paint thicknesses.

Abstract: An inspection station includes a conveyor, a first scanner, a second scanner, a controller, and an interface. The conveyor is configured to continuously transport a vehicle body through the station. The first scanner is configured to detect features of the vehicle body and associated feature coordinates relative to a global coordinate system. The second scanner is configured to detect paint thicknesses on surfaces of the vehicle body and associated paint thickness coordinates relative to the global coordinate system. The controller is programmed to map corresponding pairs of the feature coordinates and paint thickness coordinates into a single set of local coordinates having a datum defined by the vehicle body such that each of the local coordinates defines a location of one of the features relative to the datum and one of the paint thicknesses at the location. The interface is configured to display the features and corresponding paint thicknesses.

Abstract: A system for measuring a coating thickness on a target surface includes a terahertz spectroscopy device and a reference image projector. The terahertz spectroscopy device includes a radiation head that is operable to project a terahertz radiation beam onto the target surface and receive a reflected beam. The reference image projector includes a visible light device and is operable to project a reference image using the visible light device onto the target surface. A visual characteristic of the reference image indicates at least one of distance, rotational alignment, and angular alignment of the radiation head relative to the target surface.

Abstract: A system for measuring a coating thickness on a target surface includes a terahertz spectroscopy device and a reference image projector. The terahertz spectroscopy device includes a radiation head that is operable to project a terahertz radiation beam onto the target surface and receive a reflected beam. The reference image projector includes a visible light device and is operable to project a reference image using the visible light device onto the target surface. A visual characteristic of the reference image indicates at least one of distance, rotational alignment, and angular alignment of the radiation head relative to the target surface.