Patents by Inventor Marinus Van Dam

Marinus Van Dam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070058151
    Abstract: An optical element for effecting a desired change in incident radiation at a plane of an illumination system of a lithographic apparatus comprises an array of cells manufactured as a single unit, each cell being arranged to redirect the incident radiation in a predetermined direction. An array of polarizing regions is also provided, each polarizing region being associated with a corresponding cell. Each cell arranged to redirect radiation in a first direction has associated with it a polarizing region ensuring that the redirected radiation has a first polarization, so that all of the radiation redirected in the first direction has the same polarization.
    Type: Application
    Filed: September 13, 2005
    Publication date: March 15, 2007
    Applicants: ASML Netherlands B.V., Carl Zeiss SMT AG
    Inventors: Markus Franciscus Eurlings, Marinus Van Dam, Hendrikus Van Greevenbroek, Edwin Knols, Heine Mulder, Gerardus Maria Swinkels, Damian Fiolka
  • Publication number: 20060215141
    Abstract: An apparatus and method for imaging a pattern onto a substrate is described. A recipe for producing an image includes optional tool-type information. Where tool-type information indicates that the recipe pertains to a different tool type, the apparatus makes adjustments to its imaging settings in order to emulate performance of the different tool type.
    Type: Application
    Filed: March 23, 2005
    Publication date: September 28, 2006
    Applicant: ASML Netherlands B.V.
    Inventor: Marinus Van Dam
  • Publication number: 20060192149
    Abstract: A lithographic apparatus includes an illuminator configured to provide a projection beam of radiation and a polarization controller configured to control an intensity of a preferred state of polarization of the projection beam. The lithographic apparatus further includes a support configured to hold a patterning device. The patterning device configured to pattern the projection beam according to a desired pattern. The apparatus also includes a substrate table configured to hold a substrate, and a projection system configured to project the patterned beam onto a target portion of the substrate to form a patterned image on the substrate.
    Type: Application
    Filed: February 14, 2006
    Publication date: August 31, 2006
    Applicant: ASML Netherlands B.V.
    Inventors: Marinus Van Dam, Wilhelmus De Boeij, Johannes De Klerk