Patents by Inventor Mario B. Viani

Mario B. Viani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8925376
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: June 26, 2012
    Date of Patent: January 6, 2015
    Assignees: Oxford Instruments PLC, Oxford Instruments AFM, Inc
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Publication number: 20120266336
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Application
    Filed: June 26, 2012
    Publication date: October 18, 2012
    Applicant: ASYLUM RESEARCH CORPORATION
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Patent number: 8205488
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: June 26, 2012
    Assignee: Asylum Research Corporation
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Patent number: 7937991
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: June 26, 2007
    Date of Patent: May 10, 2011
    Assignee: Asylum Research Corporation
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Publication number: 20100333240
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 30, 2010
    Applicant: Asylum Research Corporation
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Patent number: 6016693
    Abstract: A sacrificial cantilever is used as a template for making cantilevers of non-standard materials for use in an atomic force microscope. The desired metal is deposited onto the sacrificial cantilever, followed by removal of the sacrificial cantilever.
    Type: Grant
    Filed: February 9, 1998
    Date of Patent: January 25, 2000
    Assignee: The Regents of the University of California
    Inventors: Mario B. Viani, Paul Hansma, Ami Chand, Mark A. Wendman, Hal J. Morrett