Abstract: In accordance with the invention, a driver circuit is described that permits a single thin gate oxide process to be utilized where a dual oxide process may normally be necessary. Circuits employing only thin gate oxide devices are used as the design basis for a single product with a single set of tooling and manufacturing process to operate within the same timing specifications for a core voltage output drive as well as for a higher system drive.

Abstract: A level shifter is presented that allows fast switching while requiring low power. In accordance with some embodiments of the invention, the level shifter is a two stage level shifting circuit with p-channel and n-channel transistors biased so as to limit the potential between the source to gate or drain to gate of any of the transistors. Pull-up transistors are placed in a transition state so that spikes resulting from an increasing or decreasing input voltage turn on or off the pull up transistors to assist in the switching.

Abstract: A level shifter is presented that allows fast switching while requiring low power. In accordance with some embodiments of the invention, the level shifter is a two stage level shifting circuit with p-channel and n-channel transistors biased so as to limit the potential between the source to gate or drain to gate of any of the transistors. Pull-up transistors are placed in a transition state so that spikes resulting from an increasing or decreasing input voltage turn on or off the pull up transistors to assist in the switching.

Abstract: In accordance with the invention, a driver circuit is described that permits a single thin gate oxide process to be utilized where a dual oxide process may normally be necessary. Circuits employing only thin gate oxide devices are used as the design basis for a single product with a single set of tooling and manufacturing process to operate within the same timing specifications for a core voltage output drive as well as for a higher system drive.

Abstract: First-in first-out (FIFO) memory devices are configured to support all four of the following FIFO memory modes: (1) DDR write with DDR read, (2) DDR write with SDR read, (3) SDR write with DDR read and (4) SDR write with SDR read. These FIFO memory devices provide flexible x4N, x2N and xN bus matching on both read and write ports and enable data to be written and read on both rising and falling edges of the write and read clock signals. Custom flag generation and retransmit circuitry is also provided that can efficiently handle any width DDR write mode with any width SDR read mode or any width SDR write mode with any width DDR read mode.

Abstract: First-in first-out (FIFO) memory devices include a plurality of memory devices that are configured to support any combination of dual data rate (DDR) or single data rate (SDR) write modes that operate in-sync with a write clock signal (WCLK) and DDR or SDR read modes that operate in-sync with a read clock signal (RCLK). These FIFO memory devices provide flexible x4N, x2N and xN bus matching on both read and write ports and enable data to be written and read on both rising and falling edges of the write and read clock signals. Custom flag generation and retransmit circuitry is also provided that can efficiently handle any width DDR write mode with any width SDR read mode or any width SDR write mode with any width DDR read mode.

Abstract: First-in first-out (FIFO) memory devices are configured to support all four of the following FIFO memory modes: (1) DDR write with DDR read, (2) DDR write with SDR read, (3) SDR write with DDR read and (4) SDR write with SDR read. These FIFO memory devices provide flexible ×4N, ×2N and ×N bus matching on both read and write ports and enable data to be written and read on both rising and falling edges of the write and read clock signals. Custom flag generation and retransmit circuitry is also provided that can efficiently handle any width DDR write mode with any width SDR read mode or any width SDR write mode with any width DDR read mode.

Abstract: First-in first-out (FIFO) memory devices are configured to support all four of the following FIFO memory modes: (1) DDR write with DDR read, (2) DDR write with SDR read, (3) SDR write with DDR read and (4) SDR write with SDR read. These FIFO memory devices provide flexible ×4N, ×2N and ×N bus matching on both read and write ports and enable data to be written and read on both rising and falling edges of the write and read clock signals. Custom flag generation and retransmit circuitry is also provided that can efficiently handle any width DDR write mode with any width SDR read mode or any width SDR write mode with any width DDR read mode.

Abstract: First-in first-out (FIFO) memory devices include a plurality of memory devices that are configured to support any combination of dual data rate (DDR) or single data rate (SDR) write modes that operate in-sync with a write clock signal (WCLK) and DDR or SDR read modes that operate in-sync with a read clock signal (RCLK). These FIFO memory devices provide flexible x4N, x2N and xN bus matching on both read and write ports and enable data to be written and read on both rising and falling edges of the write and read clock signals. Custom flag generation and retransmit circuitry is also provided that can efficiently handle any width DDR write mode with any width SDR read mode or any width SDR write mode with any width DDR read mode.