Patents by Inventor Mario Himmel

Mario Himmel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11992866
    Abstract: In a method for the online determination of at least one rolling parameter when rolling a rolling material rolled along a rolling line in a rolling mill including at least two rolls on a roll stand, the rolling material is guided past or through at least one measuring device during the rolling, which interacts with a rolling material variable of the rolling material, the rolling material variable being changeable along the length of the rolling material, and outputs a measurement signal, wherein: (i) the measurement signal is transferred into the frequency space, and the rolling parameter is determined from the measurement signal transferred into the frequency space, and/or (ii) a frequency inherent in the change of the rolling material variable is determined from the measurement signal, and the rolling parameter is determined on the basis of the determined frequency.
    Type: Grant
    Filed: June 15, 2020
    Date of Patent: May 28, 2024
    Assignee: SMS group GmbH
    Inventors: Thomas Daube, Thomas Nerzak, Joerg Himmel, Annette Jobst, Mario Radschun
  • Patent number: 9395214
    Abstract: An optical position-measuring device includes a measuring standard having a first grating in a form of a periodic incremental graduation and an absolute mark. A scanning unit is displaceable relative to the measuring standard in a measuring direction. The scanning unit has at least one second grating disposed at a scanning distance from the first grating. A first detector array is configured to obtain a first scanning signal for purposes of position determination in which the gratings are illuminated with light of a first wavelength. A second detector array is configured to obtain a second scanning signal for purposes of position determination in which the absolute mark is illuminated with light of a second wavelength. The first wavelength is shorter than the second wavelength.
    Type: Grant
    Filed: November 14, 2013
    Date of Patent: July 19, 2016
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Mario Himmel, Jarno Waetzig, Thomas Juenemann
  • Publication number: 20140146326
    Abstract: An optical position-measuring device includes a measuring standard having a first grating in a form of a periodic incremental graduation and an absolute mark. A scanning unit is displaceable relative to the measuring standard in a measuring direction. The scanning unit has at least one second grating disposed at a scanning distance from the first grating. A first detector array is configured to obtain a first scanning signal for purposes of position determination in which the gratings are illuminated with light of a first wavelength. A second detector array is configured to obtain a second scanning signal for purposes of position determination in which the absolute mark is illuminated with light of a second wavelength. The first wavelength is shorter than the second wavelength.
    Type: Application
    Filed: November 14, 2013
    Publication date: May 29, 2014
    Applicant: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Mario Himmel, Jarno Waetzig, Thomas Juenemann