Patents by Inventor Mario Reybrouck

Mario Reybrouck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7011935
    Abstract: Processes to overcome mistakes, such as, incorrect film thicknesses, poor coating quality, and incorrect feature dimensions made during the lithographic process in multilayer imaging systems are provided. To optimize manufacturing efficiency, it is desirable to be able to remove the top layer (an imaging layer) without having to remove, recoat, and usually cure the bottom layer (undercoat or underlayer). A rework process for removing an imaging layer from a substrate stack is such a process. The stack comprises a substrate, an underlayer adjacent to the substrate, and an imaging layer comprising silicon adjacent to the underlayer.
    Type: Grant
    Filed: September 18, 2003
    Date of Patent: March 14, 2006
    Assignee: Arch Specialty Chemicals, Inc.
    Inventors: Karin Schlicht, John Biafore, Mario Reybrouck
  • Publication number: 20040116312
    Abstract: Processes to overcome mistakes, such as, incorrect film thicknesses, poor coating quality, and incorrect feature dimensions made during the lithographic process in multilayer imaging systems are provided. To optimize manufacturing efficiency, it is desirable to be able to remove the top layer (an imaging layer) without having to remove, recoat, and usually cure the bottom layer (undercoat or underlayer). A rework process for removing an imaging layer from a substrate stack is such a process. The stack comprises a substrate, an underlayer adjacent to the substrate, and an imaging layer comprising silicon adjacent to the underlayer.
    Type: Application
    Filed: September 18, 2003
    Publication date: June 17, 2004
    Applicant: Arch Specialty Chemicals, Inc.
    Inventors: Karin Schlicht, John Biafore, Mario Reybrouck