Patents by Inventor Mario Viani
Mario Viani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10416190Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: GrantFiled: February 28, 2017Date of Patent: September 17, 2019Assignee: Oxford Instruments Asylum Research IncInventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
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Patent number: 10107832Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: GrantFiled: June 26, 2017Date of Patent: October 23, 2018Assignee: Oxford Instruments PLCInventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
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Publication number: 20170292971Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: ApplicationFiled: June 26, 2017Publication date: October 12, 2017Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
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Publication number: 20170254834Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: March 22, 2017Publication date: September 7, 2017Inventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Deron Walters, James Hodgson, Jonathan Hensel, Paul Costales, Anil Gannepalli
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Patent number: 9689890Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: GrantFiled: January 6, 2015Date of Patent: June 27, 2017Assignees: Oxford Instruments PLC, Oxford Instruments AFM, IncInventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
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Publication number: 20170168089Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: ApplicationFiled: February 28, 2017Publication date: June 15, 2017Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
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Patent number: 9581616Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: GrantFiled: August 4, 2015Date of Patent: February 28, 2017Assignee: Oxford Instruments Asylum Research, IncInventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
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Publication number: 20150338438Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: ApplicationFiled: August 4, 2015Publication date: November 26, 2015Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
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Patent number: 9097737Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: GrantFiled: November 25, 2013Date of Patent: August 4, 2015Assignee: Oxford Instruments Asylum Research, Inc.Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
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Publication number: 20150150163Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: ApplicationFiled: November 25, 2013Publication date: May 28, 2015Applicant: Oxford Instruments Asylum Research, Inc.Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgeson
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Publication number: 20150113687Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: ApplicationFiled: January 6, 2015Publication date: April 23, 2015Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
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Publication number: 20140223612Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: February 5, 2013Publication date: August 7, 2014Applicant: ASYLUM CORPORATIONInventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Deron Walters, James Hodgson, Jonathan Hensel, Paul Costales
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Patent number: 8370960Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: GrantFiled: October 14, 2009Date of Patent: February 5, 2013Assignee: Asylum Research CorporationInventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Daren Walters, James Hodgson, Jonathan Hensel, Paul Costales, Anil Gannepalli
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Publication number: 20100275334Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: October 14, 2009Publication date: October 28, 2010Inventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Daron Walters, James Hodgson, Jonathan Hensel, Paul Costales
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Publication number: 20080011067Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: ApplicationFiled: June 26, 2007Publication date: January 17, 2008Applicant: ASYLUM RESEARCH CORPORATIONInventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
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Patent number: 7234342Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: GrantFiled: December 18, 2003Date of Patent: June 26, 2007Assignee: Asylum Research CorporationInventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
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Publication number: 20040206166Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: ApplicationFiled: December 18, 2003Publication date: October 21, 2004Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan