Abstract: A method for determining a mass flow of bulk material in a conveyor line includes providing a conveyor line, continuously receiving bulk material, transporting the bulk material on the conveyor line, and discharging the bulk material at an end point of the conveyor line. The conveyor line includes an array of weighing cells having a plurality of weighing cells successive in a direction of transport.

Abstract: The invention relates to a THz measuring method for measuring a measured object (18), including the steps: calibration measurement with emitting a THz transmission beam (5) through an empty measuring space (6) towards a main reflector (3) along an optical axis (A) and reflection of the THz transmission beams (5) at the main reflector back to the THz-Transceiver (5), which receives a signal amplitude, where a main reflection peak (P0) at a calibration time (tP0) is determined, introducing a measured object (18) into the measuring space (6), object measurement with emitting the THz transmission beams (5) from the THz transceiver along the optical axis (A) through the measuring space and the measured object, where partial reflected beams reflected back from the boundary surfaces along the optical axis are detected at partial reflection times (t1, t2, t3, t4), and a main reflection peak (P1) generated at a main reflection time (tP1) at the main reflector (3) is detected, where, in the case that for at least on

Abstract: The present disclosure relates to a THz measuring device for measuring an extruded measuring object.

Abstract: The invention relates to a terahertz measuring apparatus (1) for run-time measurements of test objects (8), in particular, for layer thickness measurements and distance measurements of the test objects (8), whereby the terahertz measuring apparatus (1) comprises: a transmitter and receiver unit (2) for emitting a terahertz radiation (10) along an optical axis (A) and for receiving reflected terahertz radiation, a controller and evaluation unit (3) for driving the transmitter and receiver unit (2) and evaluating measuring signals (M) of the transmitter and receiver unit (2).

Abstract: The invention relates to a method for detecting a material flow (10), comprising the following steps: generating a transmitted THz beam (3) by means of a THz sensor (2), guiding the transmitted THz beam (3, 3-1, 3-2) through a material flow (10) along at least one first optical axis (A1), reflecting the transmitted THz beam (3, 3-1, 3-2) which has passed through the material flow (10) by means of at least one reflector mirror (8, 9) detecting the reflected THz reflection beam (4) and generating a signal amplitude (Sa), determining a reflector peak in the signal amplitude (Sa) corresponding to the reflector mirror, evaluating (analyzing) the determined reflector peak in an evaluating step and determining material properties of the material flow (10) depending on the evaluating step.

Abstract: The invention relates to a terahertz measuring apparatus (1) for run-time measurements of test objects (8), in particular, for layer thickness measurements and distance measurements of the test objects (8), whereby the terahertz measuring apparatus (1) comprises: a transmitter and receiver unit (2) for emitting a terahertz radiation (10) along an optical axis (A) and for receiving reflected terahertz radiation, a controller and evaluation unit (3) for driving the transmitter and receiver unit (2) and evaluating measuring signals (M) of the transmitter and receiver unit (2).

Abstract: The invention relates to a method and a terahertz measuring apparatus for measuring a layer thickness and/or a distance, wherein at least one terahertz beam (7a) is radiated from a terahertz transmission and reception unit (4) along an optical axis (C) onto the measurement object (2, 102) and terahertz radiation (7) that has passed through at least one layer (3) of the measurement object (2, 102) and having been reflected is detected wherein a measurement signal (A) of the detected reflected terahertz radiation (7b) is evaluated and a layer thickness (d) is ascertained from a propagation time difference (t2?t1) of the radiation (7) reflected at boundary layers (2a, 2b) of the layer (3).

Abstract: The invention relates to a terahertz measuring device (1) for measuring a test object (7), comprising: a THz transmitter and receiver unit (2) for emitting terahertz radiation (3) at a spatial angle of emittance (4) along an optical axis (A), receiving reflected terahertz radiation (8) and generating a signal amplitude (S) as a function of the time or frequency (t, f), and a controller and evaluator device (12) for receiving and evaluating the signal amplitude (S). Hereby, the controller and evaluator device (12) determines defects (10, 110) of the test object (7) from the signal amplitude (S). In particular, it is possible to mask a core area (4a) of the emitted terahertz radiation (3). An alternative measuring arrangement can reveal defects also by injecting the THz radiation at a right angle in that additional measuring peaks are detected which cannot be associated with the layer thickness measurement as such.

Abstract: The invention relates to a terahertz measuring device (1) for measuring a test object (7), comprising: a THz transmitter and receiver unit (2) for emitting terahertz radiation (3) at a spatial angle of emittance (4) along an optical axis (A), receiving reflected terahertz radiation (8) and generating a signal amplitude (S) as a function of the time or frequency (t, f), and a controller and evaluator device (12) for receiving and evaluating the signal amplitude (S). Hereby, the controller and evaluator device (12) determines defects (10, 110) of the test object (7) from the signal amplitude (S). In particular, it is possible to mask a core area (4a) of the emitted terahertz radiation (3). An alternative measuring arrangement can reveal defects also by injecting the THz radiation at a right angle in that additional measuring peaks are detected which cannot be associated with the layer thickness measurement as such.

Abstract: The invention relates to a method and a terahertz measuring apparatus for measuring a layer thickness and/or a distance, wherein at least one terahertz beam (7a) is radiated from a terahertz transmission and reception unit (4) along an optical axis (C) onto the measurement object (2, 102) and terahertz radiation (7) that has passed through at least one layer (3) of the measurement object (2, 102) and having been reflected is detected wherein a measurement signal (A) of the detected reflected terahertz radiation (7b) is evaluated and a layer thickness (d) is ascertained from a propagation time difference (t2?t1) of the radiation (7) reflected at boundary layers (2a, 2b) of the layer (3).