Abstract: A method for examining a circuit board in a predetermined area of the circuit board uses an apparatus that has a stationary camera and a display unit. The circuit board is arranged so as to be freely movable in the scanning zone of the camera. According to the invention, an image of the circuit board recorded by the camera, the camera image, is brought into congruence with a circuit board image, wherein the camera image and the circuit board image, after a first alignment process, are enlarged at least once in the same ratio and then re-aligned. This results in even greater congruence between camera image and circuit board image, and the predetermined area to be examined is marked in this enlarged view. In this way a user of the method according to the invention may rapidly locate the area of the circuit board to be examined, in an enlarged display, and may analyze it accordingly.

Abstract: A method for examining a circuit board in a predetermined area of the circuit board uses an apparatus that has a stationary camera and a display unit. The circuit board is arranged so as to be freely movable in the scanning zone of the camera. According to the invention, an image of the circuit board recorded by the camera, the camera image, is brought into congruence with a circuit board image, wherein the camera image and the circuit board image, after a first alignment process, are enlarged at least once in the same ratio and then re-aligned. This results in even greater congruence between camera image and circuit board image, and the predetermined area to be examined is marked in this enlarged view. In this way a user of the method according to the invention may rapidly locate the area of the circuit board to be examined, in an enlarged display, and may analyze it accordingly.