Abstract: A system for heat-treating a coil of metal can include a furnace, an unwinding system, and a quenching system. The furnace may receive the coil of metal and elevate a temperature of the metal to be within a pre-heated temperature range, such as a homogenizing temperature range or an annealing temperature range. The unwinding system may unwind at least a portion of the coil in a heated state in which the metal is within the pre-heated temperature range or before the metal has cooled past a threshold amount below the pre-heated temperature range. The quenching system may receive the unwound portion of the coil from the unwinding device and reduce a temperature of the unwound portion to a within a quenched temperature range within a predetermined amount of time.

Abstract: Systems and methods of threading a metal substrate on a rolling mill include receiving a coil of the metal substrate. The method also includes uncoiling the metal substrate from the coil while the coil and guiding the metal substrate to a work stand of the rolling mill with a threading system.

Abstract: Systems and methods of threading a metal substrate on a rolling mill include receiving a coil of the metal substrate. The method also includes uncoiling the metal substrate from the coil while the coil and guiding the metal substrate to a work stand of the rolling mill with a threading system.

Abstract: Systems and methods of threading a metal substrate on a rolling mill include receiving a coil of the metal substrate. The method also includes uncoiling the metal substrate from the coil while the coil and guiding the metal substrate to a work stand of the rolling mill with a threading system.

Abstract: Systems and methods of threading a metal substrate on a rolling mill include receiving a coil of the metal substrate. The method also includes uncoiling the metal substrate from the coil while the coil and guiding the metal substrate to a work stand of the rolling mill with a threading system.

Abstract: Systems and methods of threading a metal substrate on a rolling mill include receiving a coil of the metal substrate. The method also includes uncoiling the metal substrate from the coil while the coil and guiding the metal substrate to a work stand of the rolling mill with a threading system.

Abstract: Systems and methods of threading a metal substrate on a rolling mill include receiving a coil of the metal substrate. The method also includes uncoiling the metal substrate from the coil while the coil and guiding the metal substrate to a work stand of the rolling mill with a threading system.

Abstract: Systems and methods of threading a metal substrate on a rolling mill include receiving a coil of the metal substrate. The method also includes uncoiling the metal substrate from the coil while the coil and guiding the metal substrate to a work stand of the rolling mill with a threading system.

Abstract: Systems and methods of threading a metal substrate on a rolling mill include receiving a coil of the metal substrate. The method also includes uncoiling the metal substrate from the coil while the coil and guiding the metal substrate to a work stand of the rolling mill with a threading system.

Abstract: A method for testing a semiconductor memory device includes forcing the device into a logic state configuration that does not occur during normal operation of the device. The method may also include holding the logic state configuration for a user-variable length of time. In an embodiment, the device testing method includes flowing a direct current through a first input node of a bi-stable latch. This node may be electrically arranged between a node coupled to a voltage source and a node coupled to a circuit ground potential. An embodiment of a memory device may include testmode circuitry adapted to maintain a pair of bitlines at logic states that are not maintained during ordinary operation of the device. A system for testing a semiconductor memory device may include testmode circuitry adapted to force a pair of bitlines to the same logic state for a user-determined length of time.

Abstract: A circuit for delaying a signal. The circuit includes a scan register, a logic circuit, and a programmable delay circuit. The scan register stores scan data and the logic circuit selectively decodes the scan data. The programmable delay circuit is coupled to the logic circuit and delays a signal a programmable amount of time in response to the decoded scan data.

Abstract: A circuit for generating a pulse including a scan register having a first scan bit; first logic device receiving a first signal and generating a second signal; and a programmable delay circuit coupled to the scan register and the first logic device. The programmable delay circuit receives the second signal and generates a delayed second signal after a programmable period of time. The programmable period of time is determined by the first scan bit. The circuit also includes a logic circuit that recevies the second signal and the delayed second signal. The logic circuiit outputs the pulse having a pulse width proportional to the programmable period of time.

Abstract: An integrated circuit including a first input for receiving a scan enable control signal and a second input for receiving a test mode control signal. The integrated circuit also includes a programmable scan circuit coupled to the first input and the second input. The programmable scan circuit configures the integrated device to operate in a default mode, a scan mode, or a test mode in response to the scan enable and test mode control signals.

Abstract: A circuit including a register coupled to a control circuit. The register has a synchronous mode of operation and an asynchronous mode of operation. The a control circuit controls whether the register operates in the synchronous mode or the asynchronous mode. The circuit may further include a scan register having scan data. The control circuit may cause the register to operate in the synchronous or asynchronous mode in response to the scan data.

Abstract: A circuit for delaying a signal. The circuit includes a scan register, a logic circuit, and a programmable delay circuit. The scan register stores scan data and the logic circuit selectively decodes the scan data. The programmable delay circuit is coupled to the logic circuit and delays a signal a programmable amount of time in response to the decoded scan data.