Patents by Inventor Mark A. Hanning-Lee

Mark A. Hanning-Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6737642
    Abstract: A high speed analog to digital converter (“ADC”) that can be used in a detector system. The ADC is coupled to a detector and a processor. The detector generates an analog signal in response to the detection of a trace sample, such as an ionized molecule or a beam of light. The processor determines a baseline value and threshold value. Portions of the analog signal at or below the threshold are assigned the baseline value. The threshold typically corresponds to a value above the noise level in the system. The detector thus removes undesirable noise from the readout value. The process can compensate for factors such as DC drift while providing accurate data regarding detection of the trace sample.
    Type: Grant
    Filed: March 18, 2002
    Date of Patent: May 18, 2004
    Assignee: Syagen Technology
    Inventors: Jack A. Syage, Mark A. Hanning-Lee
  • Publication number: 20030173514
    Abstract: A high speed analog to digital converter (“ADC”) that can be used in a detector system. The ADC is coupled to a detector and a processor. The detector generates an analog signal in response to the detection of a trace sample, such as an ionized molecule or a beam of light. The processor determines a baseline value and threshold value. Portions of the analog signal at or below the threshold are assigned the baseline value. The threshold typically corresponds to a value above the noise level in the system. The detector thus removes undesirable noise from the readout value. The process can compensate for factors such as DC drift while providing accurate data regarding detection of the trace sample.
    Type: Application
    Filed: March 18, 2002
    Publication date: September 18, 2003
    Inventors: Jack A. Syage, Mark A. Hanning-Lee
  • Publication number: 20030075679
    Abstract: A monitor that can detect at least one trace molecule in a gas sample. The monitor may include a photoionizer that is coupled to an electron-ionization mass spectrometer. The photoionizer may ionize the gas sample at a wavelength(es) which ionizes the trace molecules without creating fragmentation. The inclusion of the electron-ionizer may allow alternate or additional ionization to detect trace molecules not ionized by the photoionizer. The gas sample may be ionized at atmospheric pressure which increases the yield of the ionized trace molecules and the sensitivity of the mass spectrometer.
    Type: Application
    Filed: October 16, 2001
    Publication date: April 24, 2003
    Inventors: Jack A. Syage, Karl A. Hanold, Mark A. Hanning-Lee
  • Patent number: 6329653
    Abstract: A monitor that can detect at least one trace molecule in a gas sample. The monitor may include a photoionizer that is coupled to an electron-ionization mass spectrometer. The photoionizer may ionize the gas sample at a wavelength(es) which ionizes the trace molecules without creating fragmentation. The inclusion of the electron-ionizer may allow alternate or additional ionization to detect trace molecules not ionized by the photoionizer. The gas sample may be ionized at atmospheric pressure which increases the yield of the ionized trace molecules and the sensitivity of the mass spectrometer.
    Type: Grant
    Filed: September 1, 2000
    Date of Patent: December 11, 2001
    Assignee: Syagen Technology
    Inventors: Jack A. Syage, Karl A. Hanold, Mark A. Hanning-Lee
  • Patent number: 6211516
    Abstract: A monitor that can detect at least one trace molecule in a gas sample. The monitor may include a photoionizer that is coupled to an electron-ionization mass spectrometer. The photoionizer may ionize the gas sample at a wavelength(es) which ionizes the trace molecules without creating fragmentation. The inclusion of the electron-ionizer may allow alternate or additional ionization to detect trace molecules not ionized by the photoionizer. The gas sample may be ionized at atmospheric pressure which increases the yield of the ionized trace molecules and the sensitivity of the mass spectrometer.
    Type: Grant
    Filed: February 9, 1999
    Date of Patent: April 3, 2001
    Assignee: Syagen Technology
    Inventors: Jack A. Syage, Karl A. Hanold, Mark A. Hanning-Lee