Patents by Inventor Mark A. Lambrecht

Mark A. Lambrecht has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6721694
    Abstract: A method for generating a model of a portion of the floor of a body of water from a plurality of depth measurement sources includes determining an overlap of any of the plurality of depth measurement sources with another depth measurement source and generating a relative shift between any two depth measurement sources that overlap. For each depth measurement source that overlaps with at least one other source, generating an overall shift based on the generated relative shifts. The method also includes generating a desired grid having a plurality of grid nodes and generating a model depth at a plurality of the grid nodes based, at least in part, on a global shift for the measurements of the plurality of sources based on the relative shift. Further, an output is generated of all model depths at respective grid nodes.
    Type: Grant
    Filed: October 13, 1998
    Date of Patent: April 13, 2004
    Assignee: Raytheon Company
    Inventors: Mark A. Lambrecht, Eugene J. Molinelli
  • Patent number: 6351717
    Abstract: A method for determining measurements of a surface includes determining a trend for a plurality of measurements and determining, for each of at least one of the plurality of measurements, an associated residual between the trend and the measurement and determining, for each of at least one of the associated residuals, an interpolated value for the residual. The method also includes comparing, for each of the at least one associated residuals, the residual to the interpolated value of the residual to determine whether a measurement associated with the residual is anomalous. In response to determining that a measurement associated with the residual is anomalous, the anomalous measurement is discarded. The remaining measurements then represent the surface of interest. The system includes a processor for executing a program of the method. Further, the system includes memory, an input device, and an output device.
    Type: Grant
    Filed: February 1, 2001
    Date of Patent: February 26, 2002
    Assignee: Raytheon Company
    Inventor: Mark A. Lambrecht
  • Publication number: 20010004726
    Abstract: A method for determining measurements of a surface includes determining a trend for a plurality of measurements and determining, for each of at least one of the plurality of measurements, an associated residual between the trend and the measurement and determining, for each of at least one of the associated residuals, an interpolated value for the residual. The method also includes comparing, for each of the at least one associated residuals, the residual to the interpolated value of the residual to determine whether a measurement associated with the residual is anomalous. In response to determining that a measurement associated with the residual is anomalous, the anomalous measurement is discarded. The remaining measurements then represent the surface of interest. The system includes a processor for executing a program of the method. Further, the system includes memory, an input device, and an output device.
    Type: Application
    Filed: February 1, 2001
    Publication date: June 21, 2001
    Applicant: Raytheon Company
    Inventor: Mark A. Lambrecht
  • Patent number: 6185512
    Abstract: A method for determining measurements of a surface includes determining a trend for a plurality of measurements and determining, for each of at least one of the plurality of measurements, an associated residual between the trend and the measurement and determining, for each of at least one of the associated residuals, an interpolated value for the residual. The method also includes comparing, for each of the at least one associated residuals, the residual to the interpolated value of the residual to determine whether a measurement associated with the residual is anomalous. In response to determining that a measurement associated with the residual is anomalous, the anomalous measurement is discarded. The remaining measurements then represent the surface of interest. The system includes a processor for executing a program of the method. Further, the system includes memory, an input device, and an output device.
    Type: Grant
    Filed: October 13, 1998
    Date of Patent: February 6, 2001
    Assignee: Raytheon Company
    Inventor: Mark A. Lambrecht