Patents by Inventor Mark A. Michniewicz

Mark A. Michniewicz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6268923
    Abstract: An optical method and system for measuring three-dimensional surface topography by providing high resolution contour measurements of an object using interferometric methods. The invention utilizes co-sight detector technology to provide at least three independent images of exactly the same object location, with a known fringe pattern optically introduced to each of the images. Each of the fringe patterns have a known phase difference relative to the phase appearing on each of the other images. Furthermore, the images have the same perspective relative to the object and may be collected simultaneously. This simultaneous collection of multiple phase images allows very high speed 3D data generation. Previous limitations of phase shift technology such as sample motion and vibration can be eliminated. The method may use continuous or strobed illumination.
    Type: Grant
    Filed: October 7, 1999
    Date of Patent: July 31, 2001
    Assignee: Integral Vision, Inc.
    Inventors: Mark A. Michniewicz, Matthew P. Frazer
  • Patent number: 5636025
    Abstract: An optical measuring system comprises an illumination arrangement including a light source, grating, and lens, and an image acquisition arrangement, including a lens, grating, and camera. A mechanical translation device moves the grating in a plane parallel to a reference surface to effect a phase shift of a projected image of the grating on the contoured surface to be measured. A second mechanical translation device moves the lens to effect a change in the contour interval. A first phase of the points on the contoured surface is taken, via a four-bucket algorithm, at a first contour interval. A second phase of the points is taken at a second contour interval. A controller, including a computer, determines a coarse measurement using the difference between the first and second phases. The controller further determines a fine measurement using either the first or second phase.
    Type: Grant
    Filed: June 17, 1994
    Date of Patent: June 3, 1997
    Assignee: MEDAR, Inc.
    Inventors: Leonard H. Bieman, Mark A. Michniewicz