Abstract: Provided herein are methods, systems, and devices for detecting and/or identifying one or more specific microorganisms in a culture sample. Indicator particles, such as surface enhanced Raman spectroscopy (SERS)-active nanoparticles, each having associated therewith one or more specific binding members having an affinity for the one or more microorganisms of interest, can form a complex with specific microorganisms in the culture sample. Further, agitating magnetic capture particles also having associated therewith one or more specific binding members having an affinity for the one or more microorganisms of interest can be used to capture the microorganism-indicator particle complex and concentrate the complex in a localized area of an assay vessel for subsequent detection and identification. The complex can be dispersed, pelleted, and redispersed so that the culture sample can be retested a number of times during incubation so as to allow for real-time monitoring of the culture sample.

Abstract: Provided herein are methods, systems, and devices for detecting and/or identifying one or more specific microorganisms in a culture sample. Indicator particles, such as surface enhanced Raman spectroscopy (SERS)-active nanoparticles, each having associated therewith one or more specific binding members having an affinity for the one or more microorganisms of interest, can form a complex with specific microorganisms in the culture sample. Further, agitating magnetic capture particles also having associated therewith one or more specific binding members having an affinity for the one or more microorganisms of interest can be used to capture the microorganism-indicator particle complex and concentrate the complex in a localized area of an assay vessel for subsequent detection and identification. The complex can be dispersed, pelleted, and redispersed so that the culture sample can be retested a number of times during incubation so as to allow for real-time monitoring of the culture sample.

Abstract: A load lock is provided for a semiconductor substrate processing system having a transport robot mounted therein. The load lock transport supplies substrates directly to a processing chamber without the need for a central transport robot. The load lock transport is a dual element robot designed for minimum clearance and space and operates within a matching load lock chamber of minimum volume.

Abstract: Provided herein are methods, systems, and devices for detecting and/or identifying one or more specific microorganisms in a culture sample. Indicator particles, such as surface enhanced Raman spectroscopy (SERS)-active nanoparticles, each having associated therewith one or more specific binding members having an affinity for the one or more microorganisms of interest, can form a complex with specific microorganisms in the culture sample. Further, agitating magnetic capture particles also having associated therewith one or more specific binding members having an affinity for the one or more microorganisms of interest can be used to capture the microorganism-indicator particle complex and concentrate the complex in a localized area of an assay vessel for subsequent detection and identification. The complex can be dispersed, pelleted, and redispersed so that the culture sample can be retested a number of times during incubation so as to allow for real-time monitoring of the culture sample.

Abstract: A load lock is provided for a semiconductor substrate processing system having a transport robot mounted therein. The load lock transport supplies substrates directly to a processing chamber without the need for a central transport robot. The load lock transport is a dual element robot designed for minimum clearance and space and operates within a matching load lock chamber of minimum volume.

Abstract: A load lock is provided for a semiconductor substrate processing system having a transport robot mounted therein. The load lock transport supplies substrates directly to a processing chamber without the need for a central transport robot. The load lock transport is a dual element robot designed for minimum clearance and space and operates within a matching load lock chamber of minimum volume.

Abstract: A sample tube holder having sample tube compartments with sets of spaced finger springs provided therein for maintaining sample tubes in substantially upright orientations. A guide structure having a series of openings is used to direct sample tubes into the sample tube compartments and to restrict lateral movement of sample tubes held thereby. A retainer is releasably engaged by the guide structure and has openings sized to provide access to sample tubes held by the sample tube compartments but which restrict vertical movement of the sample tubes. Tabs at a base of the sample tube holder and hold-downs fixed to a stationary structure adjacent a conveyor cooperate to restrict vertical movement of the sample tube holder during automated sampling procedures.

Abstract: A sample carrier comprising a frame and one or more sample tube receiving structures pivotally connected to the frame. Each sample tube receiving structure includes a bottom member adapted to receive a plurality of sample tubes and a top member having a plurality of aligned apertures sized to receive sample tubes therethrough. The sample tube receiving structures can be releasably locked relative to a support wall of the frame, thereby substantially immobilizing sample tubes that are held by the sample carrier.

Abstract: A sample carrier including a lower support wall, a base joined to or in fixed proximity to a bottom end of the lower support wall, and sample tube receiving areas in fixed proximity to the lower support wall for receiving and holding a plurality of sample tubes in substantially vertical orientations. The sample carrier further includes a blocking wall joined to a top end of the support wall which extends laterally over portions of sample tubes held by the sample carrier, thereby limiting vertical movement of the sample tubes during automated sampling procedures. The contents of sample tubes held by the sample carrier can be accessed by a robotic pipetting device. Additionally, a drip shield having a cover plate, a pair of through-holes for accessing sample tubes held by a the sample carrier, and a depending runner for maintaining the sample carrier on a sample carousel.

Abstract: A sample carrier comprising a lower support wall, a base joined to or in fixed proximity to a bottom end of the lower support wall, and sample tube receiving areas in fixed proximity to the lower support wall for receiving and holding a plurality of sample tubes in substantially vertical orientations. The sample carrier further comprising a blocking wall joined to a top end of the support wall which extends laterally over portions of sample tubes held by the sample carrier, thereby limiting vertical movement of the sample tubes during automated sampling procedures. The contents of sample tubes held by the sample carrier can be accessed by a robotic pipetting device. Additionally, a drip shield comprising a cover plate, a pair of through-holes for accessing sample tubes held by a the sample carrier, and a depending runner for maintaining the sample carrier on a sample carousel.

Abstract: A load lock is provided for a semiconductor substrate processing system having a transport robot mounted therein. The load lock transport supplies substrates directly to a processing chamber without the need for a central transport robot. The load lock transport is a dual element robot designed for minimum clearance and space and operates within a matching load lock chamber of minimum volume.

Abstract: A load lock is provided for a semiconductor substrate processing system having a transport robot mounted therein. The load lock transport supplies substrates directly to a processing chamber without the need for a central transport robot. The load lock transport is a dual element robot designed for minimum clearance and space and operates within a matching load lock chamber of minimum volume.

Abstract: A sample carrier comprising a lower support wall, a base joined to or in fixed proximity to a bottom end of the lower support wall, and sample tube receiving areas in fixed proximity to the lower support wall for receiving and holding a plurality of sample tubes in substantially vertical orientations. The sample carrier further comprising a blocking wall joined to a top end of the support wall which extends laterally over portions of sample tubes held by the sample carrier, thereby limiting vertical movement of the sample tubes during automated sampling procedures. The contents of sample tubes held by the sample carrier can be accessed by a robotic pipetting device. Additionally, a drip shield comprising a cover plate, a pair of through-holes for accessing sample tubes held by a the sample carrier, and a depending runner for maintaining the sample carrier on a sample carousel.

Abstract: A sample carrier comprising a frame and one or more sample tube receiving structures pivotally connected to the frame. Each sample tube receiving structure includes a bottom member adapted to receive a plurality of sample tubes and a top member having a plurality of aligned apertures sized to receive sample tubes therethrough. The sample tube receiving structures can be releasably locked relative to a support wall of the frame, thereby substantially immobilizing sample tubes that are held by the sample carrier.

Abstract: A load lock is provided for a semiconductor substrate processing system having a transport robot mounted therein. The load lock transport supplies substrates directly to a processing chamber without the need for a central transport robot. The load lock transport is a dual element robot designed for minimum clearance and space and operates within a matching load lock chamber of minimum volume.

Abstract: A sample carrier comprising a lower support wall, a base joined to or in fixed proximity to a bottom end of the lower support wall, and sample tube receiving areas in fixed proximity to the lower support wall for receiving and holding a plurality of sample tubes in substantially vertical orientations. The sample carrier further comprising a blocking wall joined to a top end of the support wall which extends laterally over portions of sample tubes held by the sample carrier, thereby limiting vertical movement of the sample tubes during automated sampling procedures. The contents of sample tubes held by the sample carrier can be accessed by a robotic pipetting device. Additionally, a drip shield comprising a cover plate, a pair of through-holes for accessing sample tubes held by a the sample carrier, and a depending runner for maintaining the sample carrier on a sample carousel.

Abstract: A sample carrier comprising a frame and one or more sample tube receiving structures pivotally connected to the frame. Each sample tube receiving structure includes a bottom member adapted to receive a plurality of sample tubes and a top member having a plurality of aligned apertures sized to receive sample tubes therethrough. The sample tube receiving structures can be releasably locked relative to a support wall of the frame, thereby substantially immobilizing sample tubes that are held by the sample carrier.

Abstract: A load lock is provided for a semiconductor substrate processing system having a transport robot mounted therein. The load lock transport supplies substrates directly to a processing chamber without the need for a central transport robot. The load lock transport is a dual element robot designed for minimum clearance and space and operates within a matching load lock chamber of minimum volume.