Patents by Inventor Mark Alan Chatelain

Mark Alan Chatelain has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Nadir emissive hyperspectral measurement operation (NEHMO)
    Patent number: 8304730
    Abstract: A method for measuring spectral characteristics includes capturing spectral-spatial data that includes radiance measurements over spectrally flat, highly emissive surface portions of a sample material and heater at least two different heater temperatures for transmissive and/or emissive configurations. Temperatures of the sample material and heater are determined at the different heater temperatures for each configuration using, in each instance, radiance measurements taken after the temperatures of the heater and sample material have both stabilized. The transmissivity of the sample material is determined using the temperatures determined in the transmissive configuration and spectral-spatial data collected at selected points of interest over the sample material. The emissivity of the sample material is determined using the temperatures determined in the emissive configuration, the spectral-spatial data collected at selected points of interest over the sample material, and the transmissivity.
    Type: Grant
    Filed: June 1, 2010
    Date of Patent: November 6, 2012
    Assignee: The Aerospace Corporation
    Inventors: Nielson Wade Schulenburg, David Wheeler Warren, Donald J. Rudy, Michael G. Martino, Mark Alan Chatelain, Michael Arthur Rocha
  • Nadir Emissive Hyperspectral Measurement Operation (NEHMO)
    Publication number: 20110292374
    Abstract: A method for measuring spectral characteristics includes capturing spectral-spatial data that includes radiance measurements over spectrally flat, highly emissive surface portions of a sample material and heater at least two different heater temperatures for transmissive and/or emissive configurations. Temperatures of the sample material and heater are determined at the different heater temperatures for each configuration using, in each instance, radiance measurements taken after the temperatures of the heater and sample material have both stabilized. The transmissivity of the sample material is determined using the temperatures determined in the transmissive configuration and spectral-spatial data collected at selected points of interest over the sample material. The emissivity of the sample material is determined using the temperatures determined in the emissive configuration, the spectral-spatial data collected at selected points of interest over the sample material, and the transmissivity.
    Type: Application
    Filed: June 1, 2010
    Publication date: December 1, 2011
    Inventors: Nielson Wade Schulenburg, David Wheeler Warren, Donald J. Rudy, Michael G. Martino, Mark Alan Chatelain, Michael Arthur Rocha