Patents by Inventor Mark Alguard

Mark Alguard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for optical alignment of a measuring head in an X-Y plane
    Patent number: 5714763
    Abstract: A two-dimensional position detector, in combination with dynamic z and/or flutter sensors, provides dynamic misalignment detection and correction of a measuring head, thereby allowing accurate determinations to be made of properties of a sheet material, such as basis weight.
    Type: Grant
    Filed: March 25, 1996
    Date of Patent: February 3, 1998
    Assignee: Measurex Corporation
    Inventors: Lee Chase, John Goss, Mark Alguard, Steve Axelrod, Peter Herzlinger, Len Anderson, Harriss King
  • System for measuring the color of a material
    Patent number: 4715715
    Abstract: A system is provided for measuring the color of a sample material, and the system includes means for illuminating the sample and a sensor to measure light from the sample. The system also includes sample backing means to receive light transmitted by the sample and reflect the light back to the sample.
    Type: Grant
    Filed: March 20, 1987
    Date of Patent: December 29, 1987
    Assignee: Measurex Corporation
    Inventors: John Howarth, Mark Alguard