Patents by Inventor Mark Allen Adamak

Mark Allen Adamak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11141128
    Abstract: The techniques disclosed may be used to detect and correct channel gain errors resulting from X-ray focal spot mis-alignment during the course of a scan. One benefit of the present invention relative to conventional techniques is that additional hardware is not required for detection of focal spot drift. Instead, the static mis-alignment of each blade is taken into account as part of estimating and correcting X-ray focal spot drift or mis-alignment. In this manner, the risk of image artefacts due to focal spot motion is reduced and the need for costly hardware solutions to detect focal spot motion is avoided.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: October 12, 2021
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Biju Jacob, Mingye Wu, Mark Allen Adamak
  • Publication number: 20210177372
    Abstract: The techniques disclosed may be used to detect and correct channel gain errors resulting from X-ray focal spot mis-alignment during the course of a scan. One benefit of the present invention relative to conventional techniques is that additional hardware is not required for detection of focal spot drift. Instead, the static mis-alignment of each blade is taken into account as part of estimating and correcting X-ray focal spot drift or mis-alignment. In this manner, the risk of image artefacts due to focal spot motion is reduced and the need for costly hardware solutions to detect focal spot motion is avoided.
    Type: Application
    Filed: December 13, 2019
    Publication date: June 17, 2021
    Inventors: Biju Jacob, Mingye Wu, Mark Allen Adamak