Patents by Inventor Mark Allen Cheverton

Mark Allen Cheverton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100009269
    Abstract: A holographic recording medium includes an optically transparent substrate. The optically transparent substrate includes an optically transparent plastic material, a photochemically active dye, and a protonated form of the photochemically active dye.
    Type: Application
    Filed: July 9, 2008
    Publication date: January 14, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Gary Charles Davis, Kathryn Longley, Moitreyee Sinha, Christoph Georg Erben, Sumeet Jain, Mark Allen Cheverton
  • Publication number: 20090325078
    Abstract: A holographic recording medium including an optically transparent substrate is provided. The optically transparent substrate includes an optically transparent plastic material and a photochemically active dye. The optically transparent substrate has an absorbance of greater than 1 at a wavelength that is in a range of from about 300 nanometers to about 1000 nanometers. The holograms recorded in the optically transparent substrate are capable of having diffraction efficiencies of greater than about 20 percent. The holographic recording medium may include a photo-product. A method of making the holographic recording medium, an optical writing and reading method, a method for using a holographic recording article, and a method of manufacturing the holographic recording medium are provided.
    Type: Application
    Filed: June 30, 2008
    Publication date: December 31, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Gary Charles Davis, Moitreyee Sinha, Brian Lee Lawrence, Christoph Georg Erben, Mark Allen Cheverton, Sumeet Jain
  • Patent number: 7371590
    Abstract: A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.
    Type: Grant
    Filed: November 21, 2005
    Date of Patent: May 13, 2008
    Assignee: General Electric Company
    Inventors: Kevin Patrick Capaldo, Mark Allen Cheverton, Dennis Joseph Coyle, Michael John Davis, Sameer Kirti Talsania, Masako Yamada, Chung-hei Yeung