Patents by Inventor Mark Allen Oerkfitz

Mark Allen Oerkfitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10578763
    Abstract: Systems and methods for assessing physical properties of a geological formation are disclosed. The systems and methods may use electrodes that include two conductive portions separated by an isolation gap positioned along a casing in a wellbore in the formation. The electrodes may be sequentially energized to provide excitation stimulus into the formation while the remaining, non-energized electrodes may substantially simultaneously receive excitation responses to the excitation stimulus from the formation. The excitation responses may be assessed to determine one or more physical properties of fractures in the formation.
    Type: Grant
    Filed: November 21, 2017
    Date of Patent: March 3, 2020
    Assignees: Board of Regents of the University of Texas System, E-Spectrum Technologies
    Inventors: Jeffrey Gabelmann, Mark Allen Oerkfitz, Thomas David Hosbach, Mukul M. Sharma, Ali Yilmaz, Carlos Torres-Verdin
  • Publication number: 20180203154
    Abstract: Systems and methods for assessing physical properties of a geological formation are disclosed. The systems and methods may use electrodes that include two conductive portions separated by an isolation gap positioned along a casing in a wellbore in the formation. The electrodes may be sequentially energized to provide excitation stimulus into the formation while the remaining, non-energized electrodes may substantially simultaneously receive excitation responses to the excitation stimulus from the formation. The excitation responses may be assessed to determine one or more physical properties of fractures in the formation.
    Type: Application
    Filed: November 21, 2017
    Publication date: July 19, 2018
    Inventors: Jeffrey Gabelmann, Mark Allen Oerkfitz, Thomas David Hosbach, Mukul M. Sharma