Abstract: An apparatus is disclosed. The apparatus has a measuring body and a first laser device supported on the measuring body and configured to emit a first laser. The apparatus also has a second laser device supported on the measuring body, the second laser device configured to emit a second laser that intersects with the first laser at a reference distance from the measuring body. The apparatus further has a laser measuring device supported on the measuring body. The laser measuring device is configured to detect a first reflection of the first laser on the measuring body, the first reflection of the first laser reflecting from a reflection distance from the measuring body. The laser measuring device is configured to detect a second reflection of the second laser on the measuring body, the second reflection of the second laser reflecting from the reflection distance.