Patents by Inventor Mark Anstrom

Mark Anstrom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9040735
    Abstract: The present invention relates to a process for hydrocyanating 3-pentenenitrile. The process can include feeding 3-pentenenitrile and HCN to a hydrocyanation reaction zone that includes a Lewis acid promoter, nickel, and a phosphorus-containing ligand. In various embodiments, the process can also include controlling water concentration within the hydrocyanation reaction zone sufficient to maintain a high activity of the ligand catalyst complex while recycling at least a portion of the ligand catalyst complex.
    Type: Grant
    Filed: October 4, 2012
    Date of Patent: May 26, 2015
    Assignee: INVISTA North America S.a.r.l.
    Inventors: Sudhir Aki, Wyatte E. Allen, Mark Anstrom, Charles Nelson Campbell, II, Tseng Chao, James E. McIntosh, Larry E. Moerbe, Bruce Edwin Murphree, Mark D. Rogers, William J. Tenn, III, Thomas E. Vos, Michael W. Wensing
  • Publication number: 20140235887
    Abstract: The present invention relates to a process for hydrocyanating 3-pentenenitrile. The process can include feeding 3-pentenenitrile and HCN to a hydrocyanation reaction zone that includes a Lewis acid promoter, nickel, and a phosphorus-containing ligand. In various embodiments, the process can also include controlling water concentration within the hydrocyanation reaction zone sufficient to maintain a high activity of the ligand catalyst complex while recycling at least a portion of the ligand catalyst complex.
    Type: Application
    Filed: October 4, 2012
    Publication date: August 21, 2014
    Applicant: INVISTA NORTH AMERICA S.A R.L.
    Inventors: Sudhir Aki, Wyatte E. Allen, Mark Anstrom, Charles Nelson Campbell, Tseng Chao, James E. Mcintosh, Larry E. Moerbe, Bruce Edwin Murphree, Mark D. Rogers, William J. Tenn, Thomas E. Vos, Michael W. Wensing