Patents by Inventor Mark Bryden Cannell

Mark Bryden Cannell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • 3D localization microscopy and 4D localization microscopy and tracking methods and systems
    Patent number: 10571674
    Abstract: A 3D localization microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: February 25, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Christian Soeller, David Michael Baddeley, Mark Bryden Cannell
  • 3D LOCALIZATION MICROSCOPY AND 4D LOCALIZATION MICROSCOPY AND TRACKING METHODS AND SYSTEMS
    Publication number: 20180348499
    Abstract: A 3D localization microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.
    Type: Application
    Filed: March 28, 2018
    Publication date: December 6, 2018
    Inventors: Christian SOELLER, David Michael BADDELEY, Mark Bryden CANNELL
  • 3D localization microscopy and 4D localization microscopy and tracking methods and systems
    Patent number: 10007103
    Abstract: A 3D localization microscopy system, 4D localization microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.
    Type: Grant
    Filed: November 3, 2016
    Date of Patent: June 26, 2018
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Christian Soeller, David Michael Baddeley, Mark Bryden Cannell
  • 3D LOCALIZATION MICROSCOPY AND 4D LOCALIZATION MICROSCOPY AND TRACKING METHODS AND SYSTEMS
    Publication number: 20170168283
    Abstract: A 3D localization microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.
    Type: Application
    Filed: November 3, 2016
    Publication date: June 15, 2017
    Inventors: Christian SOELLER, David Michael BADDELEY, Mark Bryden CANNELL
  • 3D localisation microscopy and 4D localisation microscopy and tracking methods and systems
    Patent number: 9523846
    Abstract: A 3D localization microscopy system, 4D localization microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of which image or of said light to or from the objective is related to another location independent property of the emitter.
    Type: Grant
    Filed: September 26, 2011
    Date of Patent: December 20, 2016
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Christian Soeller, David Michael Baddeley, Mark Bryden Cannell
  • 3D LOCALISATION MICROSCOPY AND 4D LOCALISATION MICROSCOPY AND TRACKING METHODS AND SYSTEMS
    Publication number: 20130300833
    Abstract: A 3D localisation microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of which image or of said light to or from the objective is related to another location independent property of the emitter.
    Type: Application
    Filed: September 26, 2011
    Publication date: November 14, 2013
    Applicant: CARL ZEISS MICROSCOPY GMBH
    Inventors: Christian Soeller, David Michael Baddeley, Mark Bryden Cannell